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Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2019). Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-trees (TDFTs). IEEE Access, 7, 29264-29276. External link
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (2018). New insights into soft-faults induced cardiac pacemakers malfunctions analyzed at system-level via model checking. IEEE Access, 6, 62107-62119. External link
Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017). Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits. Journal of Electronic Testing: Theory and Applications, 33(5), 607-620. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2015). Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits. Microelectronics Reliability, 55(1), 238-250. External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2014). New insights into the single event transient propagation through static and TSPC logic. IEEE Transactions on Nuclear Science, 61(4), 1618-1627. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2018, December). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Paper]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. External link
Bany Hamad, G., Ammar, M., Mohamed, O. A.̈., & Savaria, Y. (2018, September). System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults [Paper]. 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018), Piscataway, NJ, USA (4 pages). External link
Kazma, G., Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2017, May). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Paper]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. External link
Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017, June). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Paper]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. External link
Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2017, July). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Paper]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A.̈., Savaria, Y., & Velazco, R. (2016, September). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). External link
Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2016, September). Investigating the efficiency of cell level hardening techniques of single event transients via SMT [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). External link
Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2016, September). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). External link
Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2016, November). Efficient and accurate analysis of single event transients propagation using SMT-based techniques [Paper]. 35th International Conference on Computer-Aided Design (ICCAD 2016), Austin, TX (7 pages). External link
Ammar, M., Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2016, September). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). External link
Kazma, G., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2016, December). Investigating the efficiency and accuracy of a data type reduction technique for soft error analysis [Paper]. IEEE International Conference on Electronics, Circuits and Systems (ICECS 2016), Monte Carlo, Monaco. External link
Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2016, May). Towards formal abstraction, modeling, and analysis of single event transients at RTL [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2016), Montréal, Québec. External link
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2015, July). Efficient Multilevel Formal Analysis and Estimation of Design Vulnerability to Single Event Transients [Paper]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece (6 pages). External link
Bany Hamad, G. (2015, March). Multilevel modeling, formal analysis, and characterization of soft errors in digital systems [Paper]. EDAA/ACM SIGDA PhD Forum, Grenoble, France. Unavailable
Bany Hamad, G., Hasan, S. R., Mohamed, O. A.̈., & Savaria, Y. (2014, June). Abstracting Single Event Transient characteristics variations due to input patterns and fan-out [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A.̈., & Savaria, Y. (2014, August). Modeling, analyzing, and abstracting single event transient propagation at gate level [Paper]. IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS 2014), College Station, TX, USA. External link
Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2014, December). Probabilistic model checking of single event transient propagation at RTL level [Paper]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A.̈., & Savaria, Y. (2013, September). Investigating the impact of propagation paths and re-convergent paths on the propagation induced pulse broadening [Paper]. 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2013), Oxford, United kingdom (4 pages). External link
Bany Hamad, G., Ait Mohamed, O., Rafay Hasan, S., & Savaria, Y. (2012, May). Identification of soft error glitch-propagation paths: Leveraging SAT solvers [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2012), Seoul, Korea, Republic of. External link
Bany Hamad, G., Mohamed, O. A.̈., Hasan, S. R., & Savaria, Y. (2011, December). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Paper]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. External link
Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2016, September). SMT-based reliability-aware synthesis for single event transients tolerant combinational circuits [Poster]. Radiation Effects on Components & Systems Conference (RADECS 2016), Bremen, Germany. Unavailable
Bany Hamad, G. (2017). Multilevel Modeling, Formal Analysis, and Characterization of Single Event Transients Propagation in Digital Systems [Ph.D. thesis, École Polytechnique de Montréal]. Available
