Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria
Poster (2016)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/39441/ |
| Conference Title: | Radiation Effects on Components & Systems Conference (RADECS 2016) |
| Conference Location: | Bremen, Germany |
| Conference Date(s): | 2016-09-19 - 2016-09-23 |
| Date Deposited: | 18 Apr 2023 15:05 |
| Last Modified: | 25 Sep 2024 16:24 |
| Cite in APA 7: | Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2016, September). SMT-based reliability-aware synthesis for single event transients tolerant combinational circuits [Poster]. Radiation Effects on Components & Systems Conference (RADECS 2016), Bremen, Germany. |
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