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SMT-based reliability-aware synthesis for single event transients tolerant combinational circuits

Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria

Poster (2016)

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Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/39441/
Conference Title: Radiation Effects on Components & Systems Conference (RADECS 2016)
Conference Location: Bremen, Germany
Conference Date(s): 2016-09-19 - 2016-09-23
Date Deposited: 18 Apr 2023 15:05
Last Modified: 05 Apr 2024 11:34
Cite in APA 7: Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2016, September). SMT-based reliability-aware synthesis for single event transients tolerant combinational circuits [Poster]. Radiation Effects on Components & Systems Conference (RADECS 2016), Bremen, Germany.

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