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Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2019). Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-trees (TDFTs). IEEE Access, 7, 29264-29276. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2018, December). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Paper]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., Savaria, Y., & Velazco, R. (2016, September). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2016, September). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). External link
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (2018). New insights into soft-faults induced cardiac pacemakers malfunctions analyzed at system-level via model checking. IEEE Access, 6, 62107-62119. External link
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (2018, September). System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults [Paper]. 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018), Piscataway, NJ, USA (4 pages). External link
Bany Hamad, G. (2017). Multilevel Modeling, Formal Analysis, and Characterization of Single Event Transients Propagation in Digital Systems [Ph.D. thesis, École Polytechnique de Montréal]. Available
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (2017, July). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Paper]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. External link
Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017). Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits. Journal of Electronic Testing: Theory and Applications, 33(5), 607-620. External link
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2016, September). Investigating the efficiency of cell level hardening techniques of single event transients via SMT [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). External link
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (2016, September). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). External link
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (2016, November). Efficient and accurate analysis of single event transients propagation using SMT-based techniques [Paper]. 35th International Conference on Computer-Aided Design (ICCAD 2016), Austin, TX (7 pages). External link
Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2016, September). SMT-based reliability-aware synthesis for single event transients tolerant combinational circuits [Poster]. Radiation Effects on Components & Systems Conference (RADECS 2016), Bremen, Germany. Unavailable
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2016, May). Towards formal abstraction, modeling, and analysis of single event transients at RTL [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2016), Montréal, Québec. External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2015). Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits. Microelectronics Reliability, 55(1), 238-250. External link
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2015, July). Efficient Multilevel Formal Analysis and Estimation of Design Vulnerability to Single Event Transients [Paper]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece (6 pages). External link
Bany Hamad, G. (2015, March). Multilevel modeling, formal analysis, and characterization of soft errors in digital systems [Paper]. EDAA/ACM SIGDA PhD Forum, Grenoble, France. Unavailable
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2014, June). Abstracting Single Event Transient characteristics variations due to input patterns and fan-out [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2014, August). Modeling, analyzing, and abstracting single event transient propagation at gate level [Paper]. IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS 2014), College Station, TX, USA. External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2014). New insights into the single event transient propagation through static and TSPC logic. IEEE Transactions on Nuclear Science, 61(4), 1618-1627. External link
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2014, December). Probabilistic model checking of single event transient propagation at RTL level [Paper]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2013, September). Investigating the impact of propagation paths and re-convergent paths on the propagation induced pulse broadening [Paper]. 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2013), Oxford, United kingdom (4 pages). External link
Bany Hamad, G., Ait Mohamed, O., Rafay Hasan, S., & Savaria, Y. (2012, May). Identification of soft error glitch-propagation paths: Leveraging SAT solvers [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2012), Seoul, Korea, Republic of. External link
Bany Hamad, G., Mohamed, O. A., Hasan, S. R., & Savaria, Y. (2011, December). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Paper]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. External link
Kazma, G., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017, May). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Paper]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. External link
Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017, June). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Paper]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. External link
Kazma, G., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2016, December). Investigating the efficiency and accuracy of a data type reduction technique for soft error analysis [Paper]. IEEE International Conference on Electronics, Circuits and Systems (ICECS 2016), Monte Carlo, Monaco. External link
