Ghaith Bany Hamad, Ghaith Kazma, Otmane Aı̈t Mohamed and Yvon Savaria
Paper (2017)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9781538603529 |
| PolyPublie URL: | https://publications.polymtl.ca/38639/ |
| Conference Title: | 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017) |
| Conference Location: | Thessaloniki, Greece |
| Conference Date(s): | 2017-07-03 - 2017-07-05 |
| Publisher: | IEEE |
| DOI: | 10.1109/iolts.2017.8046195 |
| Official URL: | https://doi.org/10.1109/iolts.2017.8046195 |
| Date Deposited: | 18 Apr 2023 15:04 |
| Last Modified: | 08 Apr 2025 12:22 |
| Cite in APA 7: | Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2017, July). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Paper]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. https://doi.org/10.1109/iolts.2017.8046195 |
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