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Ammar, M., Hamad, G. B., Mohamed, O. A.̈., & Savaria, Y. (2019). System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs). In Velazco, R., McMorrow, D., & Estela, J. (eds.), Radiation Effects on Integrated Circuits and Systems for Space Applications (pp. 13-38). External link
Ammar, M., Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2018, December). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Paper]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A.̈., Savaria, Y., & Velazco, R. (2016, September). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). External link
Ammar, M., Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2016, September). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). External link
Bany Hamad, G., Ammar, M., Mohamed, O. A.̈., & Savaria, Y. (2018, September). System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults [Paper]. 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018), Piscataway, NJ, USA (4 pages). External link
Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2017, July). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Paper]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. External link
Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2016, September). Investigating the efficiency of cell level hardening techniques of single event transients via SMT [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). External link
Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2016, September). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). External link
Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2016, November). Efficient and accurate analysis of single event transients propagation using SMT-based techniques [Paper]. 35th International Conference on Computer-Aided Design (ICCAD 2016), Austin, TX (7 pages). External link
Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2016, May). Towards formal abstraction, modeling, and analysis of single event transients at RTL [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2016), Montréal, Québec. External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A.̈., & Savaria, Y. (2014, June). Abstracting Single Event Transient characteristics variations due to input patterns and fan-out [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A.̈., & Savaria, Y. (2014, August). Modeling, analyzing, and abstracting single event transient propagation at gate level [Paper]. IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS 2014), College Station, TX, USA. External link
Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2014, December). Probabilistic model checking of single event transient propagation at RTL level [Paper]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. External link
Bany Hamad, G., Hasan, S. R., Mohamed, O. A.̈., & Savaria, Y. (2013, September). Investigating the impact of propagation paths and re-convergent paths on the propagation induced pulse broadening [Paper]. 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2013), Oxford, United kingdom (4 pages). External link
Bany Hamad, G., Mohamed, O. A.̈., Hasan, S. R., & Savaria, Y. (2011, December). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Paper]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. External link
Hoque, K. A., Mohamed, O. A.̈., & Savaria, Y. (2016, April). Applying formal verification to early assessment of FPGA-based aerospace applications: Methodology and experience [Paper]. Annual IEEE Systems Conference (SysCon 2016), Orlando, Flordia (6 pages). External link
Hoque, K. A., Mohamed, O. A.̈., & Savaria, Y. (2015, March). Towards an accurate reliability, availability and maintainability analysis approach for satellite systems based on probabilistic model checking [Paper]. Design, Automation and Test in Europe Conference and Exhibition (DATE 2015), Grenoble, France. External link
Hoque, K. A., Mohamed, O. A.̈., Savaria, Y., & Thibeault, C. (2014, October). Probabilistic model checking based DAL analysis to optimize a combined TMR-blind-scrubbing mitigation technique for FPGA-based aerospace applications [Paper]. 12th ACM/IEEE International Conference on Methods and Models for System Design (MEMOCODE 2014), Lausanne, Switzerland. External link
Kazma, G., Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2017, May). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Paper]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. External link
