Ghaith Bany Hamad, Otmane Aı̈t Mohamed, Syed Rafay Hasan and Yvon Savaria
Paper (2011)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9781457718441 |
| PolyPublie URL: | https://publications.polymtl.ca/39551/ |
| Conference Title: | 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011) |
| Conference Location: | Beirut, Lebanon |
| Conference Date(s): | 2011-12-11 - 2011-12-14 |
| Publisher: | IEEE |
| DOI: | 10.1109/icecs.2011.6122287 |
| Official URL: | https://doi.org/10.1109/icecs.2011.6122287 |
| Date Deposited: | 18 Apr 2023 15:11 |
| Last Modified: | 08 Apr 2025 12:19 |
| Cite in APA 7: | Bany Hamad, G., Mohamed, O. A.̈., Hasan, S. R., & Savaria, Y. (2011, December). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Paper]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. https://doi.org/10.1109/icecs.2011.6122287 |
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