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SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level

Ghaith Bany Hamad, Otmane Ait Mohamed, Syed Rafay Hasan and Yvon Savaria

Paper (2011)

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Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/39551/
Conference Title: 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011)
Conference Location: Beirut, Lebanon
Conference Date(s): 2011-12-11 - 2011-12-14
Publisher: IEEE
DOI: 10.1109/icecs.2011.6122287
Official URL: https://doi.org/10.1109/icecs.2011.6122287
Date Deposited: 18 Apr 2023 15:11
Last Modified: 25 Sep 2024 16:24
Cite in APA 7: Bany Hamad, G., Mohamed, O. A., Hasan, S. R., & Savaria, Y. (2011, December). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Paper]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. https://doi.org/10.1109/icecs.2011.6122287

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