Ghaith Bany Hamad, Otmane Ait Mohamed, Syed Rafay Hasan and Yvon Savaria
Paper (2011)
An external link is available for this itemDepartment: | Department of Electrical Engineering |
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Research Center: | GR2M - Microelectronics and Microsystems Research Group |
PolyPublie URL: | https://publications.polymtl.ca/39551/ |
Conference Title: | 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011) |
Conference Location: | Beirut, Lebanon |
Conference Date(s): | 2011-12-11 - 2011-12-14 |
Publisher: | IEEE |
DOI: | 10.1109/icecs.2011.6122287 |
Official URL: | https://doi.org/10.1109/icecs.2011.6122287 |
Date Deposited: | 18 Apr 2023 15:11 |
Last Modified: | 25 Sep 2024 16:24 |
Cite in APA 7: | Bany Hamad, G., Mohamed, O. A., Hasan, S. R., & Savaria, Y. (2011, December). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Paper]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. https://doi.org/10.1109/icecs.2011.6122287 |
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