Ghaith Bany Hamad, Ghaith Kazma, Otmane Aı̈t Mohamed, Yvon Savaria
Paper (2016)
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ISBN:
9791092279177
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Conference Title:
Forum on Specification and Design Languages (FDL 2016)
Conference Location:
Bremen, Germany
Conference Date(s):
2016-09-14 - 2016-09-16
Publisher:
IEEE
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OAI:
oai:publications.polymtl.ca:36967
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Date Deposited:
18 Apr 2023 15:05
Last Modified:
08 Oct 2026 17:52
Cite in APA 7:
Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2016, September). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). https://doi.org/10.1109/fdl.2016.7880371
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