Ghaith Bany Hamad, Ghaith Kazma, Otmane Ait Mohamed and Yvon Savaria
Paper (2016)
An external link is available for this itemDepartment: | Department of Electrical Engineering |
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Research Center: | GR2M - Microelectronics and Microsystems Research Group |
PolyPublie URL: | https://publications.polymtl.ca/36967/ |
Conference Title: | Forum on Specification and Design Languages (FDL 2016) |
Conference Location: | Bremen, Germany |
Conference Date(s): | 2016-09-14 - 2016-09-16 |
Publisher: | IEEE |
DOI: | 10.1109/fdl.2016.7880371 |
Official URL: | https://doi.org/10.1109/fdl.2016.7880371 |
Date Deposited: | 18 Apr 2023 15:05 |
Last Modified: | 25 Sep 2024 16:21 |
Cite in APA 7: | Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (2016, September). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). https://doi.org/10.1109/fdl.2016.7880371 |
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