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Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients

Ghaith Bany Hamad, Ghaith Kazma, Otmane Ait Mohamed and Yvon Savaria

Paper (2016)

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Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/36967/
Conference Title: Forum on Specification and Design Languages (FDL 2016)
Conference Location: Bremen, Germany
Conference Date(s): 2016-09-14 - 2016-09-16
Publisher: IEEE
DOI: 10.1109/fdl.2016.7880371
Official URL: https://doi.org/10.1109/fdl.2016.7880371
Date Deposited: 18 Apr 2023 15:05
Last Modified: 25 Sep 2024 16:21
Cite in APA 7: Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (2016, September). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). https://doi.org/10.1109/fdl.2016.7880371

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