Ghaith Bany Hamad, Marwan Ammar, Otmane Ait Mohamed and Yvon Savaria
Paper (2018)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/47717/ |
| Conference Title: | 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018) |
| Conference Location: | Piscataway, NJ, USA |
| Conference Date(s): | 2018-09-16 - 2018-09-21 |
| Publisher: | IEEE |
| DOI: | 10.1109/radecs45761.2018.9328702 |
| Official URL: | https://doi.org/10.1109/radecs45761.2018.9328702 |
| Date Deposited: | 18 Apr 2023 15:03 |
| Last Modified: | 23 Aug 2024 16:32 |
| Cite in APA 7: | Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (2018, September). System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults [Paper]. 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018), Piscataway, NJ, USA (4 pages). https://doi.org/10.1109/radecs45761.2018.9328702 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
