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The word cloud is a useful tool for identifying trends and main themes in a corpus of texts, thus facilitating the understanding and analysis of content in a visual and intuitive way.
Ammar, M., Hamad, G. B., Mohamed, O. A.̈., & Savaria, Y. (2019). System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs). In Velazco, R., McMorrow, D., & Estela, J. (eds.), Radiation Effects on Integrated Circuits and Systems for Space Applications (pp. 13-38). External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2019). Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-trees (TDFTs). IEEE Access, 7, 29264-29276. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2018, December). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Paper]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., Savaria, Y., & Velazco, R. (2016, September). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. External link
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2016, September). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). External link
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (2018). New insights into soft-faults induced cardiac pacemakers malfunctions analyzed at system-level via model checking. IEEE Access, 6, 62107-62119. External link
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (2018, September). System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults [Paper]. 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018), Piscataway, NJ, USA (4 pages). External link
