Marwan Ammar, Ghaith Bany Hamad, Otmane Aı̈t Mohamed and Yvon Savaria
Book Section (2019)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 9783030046606 |
| PolyPublie URL: | https://publications.polymtl.ca/61205/ |
| Editors: | Raoul Velazco, Dale McMorrow and Jaime Estela |
| Journal Title: | Springer eBooks |
| Publisher: | Springer Nature |
| DOI: | 10.1007/978-3-030-04660-6_2 |
| Official URL: | https://doi.org/10.1007/978-3-030-04660-6_2 |
| Date Deposited: | 17 Dec 2024 12:06 |
| Last Modified: | 17 Dec 2024 12:06 |
| Cite in APA 7: | Ammar, M., Hamad, G. B., Mohamed, O. A.̈., & Savaria, Y. (2019). System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs). In Velazco, R., McMorrow, D., & Estela, J. (eds.), Radiation Effects on Integrated Circuits and Systems for Space Applications (pp. 13-38). https://doi.org/10.1007/978-3-030-04660-6_2 |
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