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Documents dont l'auteur est "Hamad, Ghaith Bany"

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Nombre de documents: 13

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Ammar, M., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (2019). Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-trees (TDFTs). IEEE Access, 7, 29264-29276. Lien externe

Ammar, M., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (décembre 2018). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Communication écrite]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. Lien externe

Ammar, M., Hamad, G. B., Mohamed, O. A., Savaria, Y., & Velazco, R. (septembre 2016). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe

Ammar, M., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. Lien externe

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Hamad, G. B., Ammar, M., Mohamed, O. A., & Savaria, Y. (2018). New insights into soft-faults induced cardiac pacemakers malfunctions analyzed at system-level via model checking. IEEE Access, 6, 62107-62119. Lien externe

Hamad, G. B., Ait Mohamed, O., & Savaria, Y. (2017). Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits. Journal of Electronic Testing: Theory and Applications, 33(5), 607-620. Lien externe

Hamad, G. B., Mohamed, O. A., & Savaria, Y. (septembre 2016). Investigating the efficiency of cell level hardening techniques of single event transients via SMT [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe

Hamad, G. B. (mars 2015). Multilevel modeling, formal analysis, and characterization of soft errors in digital systems [Communication écrite]. EDAA/ACM SIGDA PhD Forum, Grenoble, France. Non disponible

Hamad, G. B., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (juin 2014). Abstracting Single Event Transient characteristics variations due to input patterns and fan-out [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). Lien externe

Hamad, G. B., Mohamed, O. A., & Savaria, Y. (décembre 2014). Probabilistic model checking of single event transient propagation at RTL level [Communication écrite]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. Lien externe

Hamad, G. B., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (septembre 2013). Investigating the impact of propagation paths and re-convergent paths on the propagation induced pulse broadening [Communication écrite]. 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2013), Oxford, United kingdom (4 pages). Lien externe

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Kazma, G., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (mai 2017). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Communication écrite]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. Lien externe

Kazma, G., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (décembre 2016). Investigating the efficiency and accuracy of a data type reduction technique for soft error analysis [Communication écrite]. IEEE International Conference on Electronics, Circuits and Systems (ICECS 2016), Monte Carlo, Monaco. Lien externe

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