Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria
Article (2019)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/43061/ |
| Journal Title: | IEEE Access (vol. 7) |
| Publisher: | IEEE |
| DOI: | 10.1109/access.2019.2902796 |
| Official URL: | https://doi.org/10.1109/access.2019.2902796 |
| Date Deposited: | 18 Apr 2023 15:01 |
| Last Modified: | 08 Apr 2025 07:07 |
| Cite in APA 7: | Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2019). Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-trees (TDFTs). IEEE Access, 7, 29264-29276. https://doi.org/10.1109/access.2019.2902796 |
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