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Items where Author is "Mohamed, Otmane Ait"

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Number of items: 6.

A

Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2019). Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-trees (TDFTs). IEEE Access, 7, 29264-29276. External link

Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. External link

B

Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2015, July). Efficient Multilevel Formal Analysis and Estimation of Design Vulnerability to Single Event Transients [Paper]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece (6 pages). External link

Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2014). New insights into the single event transient propagation through static and TSPC logic. IEEE Transactions on Nuclear Science, 61(4), 1618-1627. External link

K

Kazma, G., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2016, December). Investigating the efficiency and accuracy of a data type reduction technique for soft error analysis [Paper]. IEEE International Conference on Electronics, Circuits and Systems (ICECS 2016), Monte Carlo, Monaco. External link

T

Trabelsi, A., Mohamed, O. A., & Audet, Y. (2015). Robust parametric modeling of speech in additive white Gaussian noise. Journal of Signal and Information Processing, 6(2), 99-108. Available

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