Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria
Paper (2015)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9781467379052 |
| PolyPublie URL: | https://publications.polymtl.ca/36185/ |
| Conference Title: | 21st International On-Line Testing Symposium (IOLTS 2015) |
| Conference Location: | Athena Pallas, Greece |
| Conference Date(s): | 2015-07-06 - 2015-07-08 |
| Publisher: | IEEE |
| DOI: | 10.1109/iolts.2015.7229818 |
| Official URL: | https://doi.org/10.1109/iolts.2015.7229818 |
| Date Deposited: | 18 Apr 2023 15:06 |
| Last Modified: | 25 Sep 2024 16:20 |
| Cite in APA 7: | Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2015, July). Efficient Multilevel Formal Analysis and Estimation of Design Vulnerability to Single Event Transients [Paper]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece (6 pages). https://doi.org/10.1109/iolts.2015.7229818 |
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