System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking

Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria

Article (2017)

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Department:	Department of Electrical Engineering
Research Center:	GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL:	https://publications.polymtl.ca/38595/
Journal Title:	IEEE Transactions on Nuclear Science (vol. 64, no. 9)
Publisher:	IEEE
DOI:	10.1109/tns.2017.2736061
Official URL:	https://doi.org/10.1109/tns.2017.2736061
Date Deposited:	18 Apr 2023 15:03
Last Modified:	23 Aug 2024 16:39

Cite in APA 7:	Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. https://doi.org/10.1109/tns.2017.2736061
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