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Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2019). Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-trees (TDFTs). IEEE Access, 7, 29264-29276. Lien externe
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. Lien externe
Trabelsi, A., Mohamed, O. A., & Audet, Y. (2015). Robust parametric modeling of speech in additive white Gaussian noise. Journal of Signal and Information Processing, 6(2), 99-108. Disponible
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2014). New insights into the single event transient propagation through static and TSPC logic. IEEE Transactions on Nuclear Science, 61(4), 1618-1627. Lien externe
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (décembre 2018). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Communication écrite]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. Lien externe
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (septembre 2018). System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults [Communication écrite]. 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018), Piscataway, NJ, USA (4 pages). Lien externe
Kazma, G., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (mai 2017). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Communication écrite]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. Lien externe
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (juillet 2017). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Communication écrite]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. Lien externe
Ammar, M., Bany Hamad, G., Mohamed, O. A., Savaria, Y., & Velazco, R. (septembre 2016). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (septembre 2016). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Communication écrite]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). Lien externe
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (novembre 2016). Efficient and accurate analysis of single event transients propagation using SMT-based techniques [Communication écrite]. 35th International Conference on Computer-Aided Design (ICCAD 2016), Austin, TX (7 pages). Lien externe
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (septembre 2016). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Communication écrite]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). Lien externe
Kazma, G., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (décembre 2016). Investigating the efficiency and accuracy of a data type reduction technique for soft error analysis [Communication écrite]. IEEE International Conference on Electronics, Circuits and Systems (ICECS 2016), Monte Carlo, Monaco. Lien externe
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (mai 2016). Towards formal abstraction, modeling, and analysis of single event transients at RTL [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2016), Montréal, Québec. Lien externe
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (juillet 2015). Efficient Multilevel Formal Analysis and Estimation of Design Vulnerability to Single Event Transients [Communication écrite]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece (6 pages). Lien externe
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (juin 2014). Abstracting Single Event Transient characteristics variations due to input patterns and fan-out [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). Lien externe
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (août 2014). Modeling, analyzing, and abstracting single event transient propagation at gate level [Communication écrite]. IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS 2014), College Station, TX, USA. Lien externe
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (décembre 2014). Probabilistic model checking of single event transient propagation at RTL level [Communication écrite]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. Lien externe
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (septembre 2013). Investigating the impact of propagation paths and re-convergent paths on the propagation induced pulse broadening [Communication écrite]. 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2013), Oxford, United kingdom (4 pages). Lien externe
Bany Hamad, G., Mohamed, O. A., Hasan, S. R., & Savaria, Y. (décembre 2011). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Communication écrite]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. Lien externe
