Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria
and Raoul Velazco
Paper (2016)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/39527/ |
| Conference Title: | 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016) |
| Conference Location: | Bremen, Germany |
| Conference Date(s): | 2016-09-19 - 2016-09-23 |
| Publisher: | IEEE |
| DOI: | 10.1109/radecs.2016.8093191 |
| Official URL: | https://doi.org/10.1109/radecs.2016.8093191 |
| Date Deposited: | 18 Apr 2023 15:03 |
| Last Modified: | 25 Sep 2024 16:24 |
| Cite in APA 7: | Ammar, M., Bany Hamad, G., Mohamed, O. A., Savaria, Y., & Velazco, R. (2016, September). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). https://doi.org/10.1109/radecs.2016.8093191 |
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