Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking

Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria and Raoul Velazco

Paper (2016)

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Department:	Department of Electrical Engineering
PolyPublie URL:	https://publications.polymtl.ca/39527/
Conference Title:	16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016)
Conference Location:	Bremen, Germany
Conference Date(s):	2016-09-19 - 2016-09-23
Publisher:	IEEE
DOI:	10.1109/radecs.2016.8093191
Official URL:	https://doi.org/10.1109/radecs.2016.8093191
Date Deposited:	18 Apr 2023 15:03
Last Modified:	05 May 2023 15:44

Cite in APA 7:	Ammar, M., Hamad, G. B., Mohamed, O. A., Savaria, Y., & Velazco, R. (2016, September). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). https://doi.org/10.1109/radecs.2016.8093191
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