Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria
Paper (2016)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/36849/ |
| Conference Title: | Forum on Specification and Design Languages (FDL 2016) |
| Conference Location: | Bremen, Germany |
| Conference Date(s): | 2016-09-14 - 2016-09-16 |
| Publisher: | IEEE |
| DOI: | 10.1109/fdl.2016.7880373 |
| Official URL: | https://doi.org/10.1109/fdl.2016.7880373 |
| Date Deposited: | 18 Apr 2023 15:05 |
| Last Modified: | 25 Sep 2024 16:20 |
| Cite in APA 7: | Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2016, September). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). https://doi.org/10.1109/fdl.2016.7880373 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
