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Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking

M. Ammar, G. B. Hamad, O. A. Mohamed and Yvon Savaria

Paper (2016)

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Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/36849/
Conference Title: Forum on Specification and Design Languages (FDL 2016)
Conference Location: Bremen, Germany
Conference Date(s): 2016-09-14 - 2016-09-16
Publisher: IEEE
DOI: 10.1109/fdl.2016.7880373
Official URL: https://doi.org/10.1109/fdl.2016.7880373
Date Deposited: 18 Apr 2023 15:05
Last Modified: 05 Apr 2024 11:30
Cite in APA 7: Ammar, M., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (2016, September). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). https://doi.org/10.1109/fdl.2016.7880373

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