Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria
Paper (2018)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/42763/ |
| Conference Title: | 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018) |
| Conference Location: | Bordeaux, France |
| Conference Date(s): | 2018-12-09 - 2018-12-12 |
| Publisher: | IEEE |
| DOI: | 10.1109/icecs.2018.8617845 |
| Official URL: | https://doi.org/10.1109/icecs.2018.8617845 |
| Date Deposited: | 18 Apr 2023 15:02 |
| Last Modified: | 23 Aug 2024 16:40 |
| Cite in APA 7: | Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2018, December). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Paper]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. https://doi.org/10.1109/icecs.2018.8617845 |
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