Ghaith Kazma, Ghaith Bany Hamad, Otmane Aı̈t Mohamed and Yvon Savaria
Paper (2017)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9781450349727 |
| PolyPublie URL: | https://publications.polymtl.ca/36982/ |
| Conference Title: | Great Lakes Symposium on VLSI (GLSVLSI 2017) |
| Conference Location: | Banff, Alberta |
| Conference Date(s): | 2017-05-10 - 2017-05-12 |
| Publisher: | Association for Computing Machinery |
| DOI: | 10.1145/3060403.3060438 |
| Official URL: | https://doi.org/10.1145/3060403.3060438 |
| Date Deposited: | 18 Apr 2023 15:04 |
| Last Modified: | 08 Apr 2025 12:22 |
| Cite in APA 7: | Kazma, G., Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (2017, May). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Paper]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. https://doi.org/10.1145/3060403.3060438 |
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