Probabilistic model checking of single event transient propagation at RTL level

Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria

Paper (2014)

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Department:	Department of Electrical Engineering
Research Center:	GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL:	https://publications.polymtl.ca/12226/
Conference Title:	21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014)
Conference Location:	Marseille, France
Conference Date(s):	2014-12-07 - 2014-12-10
Publisher:	IEEE
DOI:	10.1109/icecs.2014.7050019
Official URL:	https://doi.org/10.1109/icecs.2014.7050019
Date Deposited:	18 Apr 2023 15:08
Last Modified:	25 Sep 2024 15:48

Cite in APA 7:	Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2014, December). Probabilistic model checking of single event transient propagation at RTL level [Paper]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. https://doi.org/10.1109/icecs.2014.7050019
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