Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria
Paper (2014)
An external link is available for this itemDepartment: | Department of Electrical Engineering |
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Research Center: | GR2M - Microelectronics and Microsystems Research Group |
PolyPublie URL: | https://publications.polymtl.ca/12226/ |
Conference Title: | 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014) |
Conference Location: | Marseille, France |
Conference Date(s): | 2014-12-07 - 2014-12-10 |
Publisher: | IEEE |
DOI: | 10.1109/icecs.2014.7050019 |
Official URL: | https://doi.org/10.1109/icecs.2014.7050019 |
Date Deposited: | 18 Apr 2023 15:08 |
Last Modified: | 25 Sep 2024 15:48 |
Cite in APA 7: | Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2014, December). Probabilistic model checking of single event transient propagation at RTL level [Paper]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. https://doi.org/10.1109/icecs.2014.7050019 |
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