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Probabilistic model checking of single event transient propagation at RTL level

Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria

Paper (2014)

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Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/12226/
Conference Title: 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014)
Conference Location: Marseille, France
Conference Date(s): 2014-12-07 - 2014-12-10
Publisher: IEEE
DOI: 10.1109/icecs.2014.7050019
Official URL: https://doi.org/10.1109/icecs.2014.7050019
Date Deposited: 18 Apr 2023 15:08
Last Modified: 05 Apr 2024 10:51
Cite in APA 7: Hamad, G. B., Mohamed, O. A., & Savaria, Y. (2014, December). Probabilistic model checking of single event transient propagation at RTL level [Paper]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. https://doi.org/10.1109/icecs.2014.7050019

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