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Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2019). Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-trees (TDFTs). IEEE Access, 7, 29264-29276. Lien externe
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (2018). New insights into soft-faults induced cardiac pacemakers malfunctions analyzed at system-level via model checking. IEEE Access, 6, 62107-62119. Lien externe
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (décembre 2018). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Communication écrite]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. Lien externe
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (septembre 2018). System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults [Communication écrite]. 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018), Piscataway, NJ, USA (4 pages). Lien externe
Bany Hamad, G. (2017). Multilevel Modeling, Formal Analysis, and Characterization of Single Event Transients Propagation in Digital Systems [Thèse de doctorat, École Polytechnique de Montréal]. Disponible
Kazma, G., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (mai 2017). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Communication écrite]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. Lien externe
Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (juin 2017). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Communication écrite]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. Lien externe
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (juillet 2017). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Communication écrite]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. Lien externe
Ammar, M., Bany Hamad, G., Mohamed, O. A., Savaria, Y., & Velazco, R. (septembre 2016). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe
Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017). Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits. Journal of Electronic Testing: Theory and Applications, 33(5), 607-620. Lien externe
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (septembre 2016). Investigating the efficiency of cell level hardening techniques of single event transients via SMT [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. Lien externe
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (septembre 2016). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Communication écrite]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). Lien externe
Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (novembre 2016). Efficient and accurate analysis of single event transients propagation using SMT-based techniques [Communication écrite]. 35th International Conference on Computer-Aided Design (ICCAD 2016), Austin, TX (7 pages). Lien externe
Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (septembre 2016). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Communication écrite]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). Lien externe
Kazma, G., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (décembre 2016). Investigating the efficiency and accuracy of a data type reduction technique for soft error analysis [Communication écrite]. IEEE International Conference on Electronics, Circuits and Systems (ICECS 2016), Monte Carlo, Monaco. Lien externe
Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (septembre 2016). SMT-based reliability-aware synthesis for single event transients tolerant combinational circuits [Affiche]. Radiation Effects on Components & Systems Conference (RADECS 2016), Bremen, Germany. Non disponible
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (mai 2016). Towards formal abstraction, modeling, and analysis of single event transients at RTL [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2016), Montréal, Québec. Lien externe
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2015). Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits. Microelectronics Reliability, 55(1), 238-250. Lien externe
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (juillet 2015). Efficient Multilevel Formal Analysis and Estimation of Design Vulnerability to Single Event Transients [Communication écrite]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece (6 pages). Lien externe
Bany Hamad, G. (mars 2015). Multilevel modeling, formal analysis, and characterization of soft errors in digital systems [Communication écrite]. EDAA/ACM SIGDA PhD Forum, Grenoble, France. Non disponible
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (juin 2014). Abstracting Single Event Transient characteristics variations due to input patterns and fan-out [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). Lien externe
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (août 2014). Modeling, analyzing, and abstracting single event transient propagation at gate level [Communication écrite]. IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS 2014), College Station, TX, USA. Lien externe
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2014). New insights into the single event transient propagation through static and TSPC logic. IEEE Transactions on Nuclear Science, 61(4), 1618-1627. Lien externe
Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (décembre 2014). Probabilistic model checking of single event transient propagation at RTL level [Communication écrite]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. Lien externe
Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (septembre 2013). Investigating the impact of propagation paths and re-convergent paths on the propagation induced pulse broadening [Communication écrite]. 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2013), Oxford, United kingdom (4 pages). Lien externe
Bany Hamad, G., Ait Mohamed, O., Rafay Hasan, S., & Savaria, Y. (mai 2012). Identification of soft error glitch-propagation paths: Leveraging SAT solvers [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2012), Seoul, Korea, Republic of. Lien externe
Bany Hamad, G., Mohamed, O. A., Hasan, S. R., & Savaria, Y. (décembre 2011). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Communication écrite]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. Lien externe
