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Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories

Ghaith Kazma, Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria

Paper (2017)

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Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/38491/
Conference Title: 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017)
Conference Location: Strasbourg, France
Conference Date(s): 2017-06-25 - 2017-06-28
Publisher: IEEE
DOI: 10.1109/newcas.2017.8010149
Official URL: https://doi.org/10.1109/newcas.2017.8010149
Date Deposited: 18 Apr 2023 15:04
Last Modified: 25 Sep 2024 16:22
Cite in APA 7: Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017, June). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Paper]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. https://doi.org/10.1109/newcas.2017.8010149

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