Ghaith Kazma, Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria
Paper (2017)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9781509049912 |
| PolyPublie URL: | https://publications.polymtl.ca/38491/ |
| Conference Title: | 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017) |
| Conference Location: | Strasbourg, France |
| Conference Date(s): | 2017-06-25 - 2017-06-28 |
| Publisher: | IEEE |
| DOI: | 10.1109/newcas.2017.8010149 |
| Official URL: | https://doi.org/10.1109/newcas.2017.8010149 |
| Date Deposited: | 18 Apr 2023 15:04 |
| Last Modified: | 08 Apr 2025 12:22 |
| Cite in APA 7: | Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017, June). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Paper]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. https://doi.org/10.1109/newcas.2017.8010149 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
