<  Back to the Polytechnique Montréal portal

Items where Author is "Ait Mohamed, Otmane"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Jump to: A | B | H | K
Number of items: 8.

A

Al-bayati, Z., Ait Mohamed, O., Rafay Hasan, S., & Savaria, Y. (2012, December). Design of a C-element based clock domain crossing interface [Paper]. 24th International Conference on Microelectronics (ICM 2012), Algiers, Algeria (4 pages). External link

B

Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2016, September). SMT-based reliability-aware synthesis for single event transients tolerant combinational circuits [Poster]. Radiation Effects on Components & Systems Conference (RADECS 2016), Bremen, Germany. Unavailable

Bany Hamad, G., Ait Mohamed, O., Rafay Hasan, S., & Savaria, Y. (2012, May). Identification of soft error glitch-propagation paths: Leveraging SAT solvers [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2012), Seoul, Korea, Republic of. External link

H

Hoque, K. A., Ait Mohamed, O., & Savaria, Y. (2019). Dependability modeling and optimization of triple modular redundancy partitioning for SRAM-based FPGAs. Reliability Engineering and System Safety, 182, 107-119. External link

Hoque, K. A., Ait Mohamed, O., & Savaria, Y. (2017). Formal analysis of SEU mitigation for early dependability and performability analysis of FPGA-based space applications. Journal of Applied Logic, 25(47-68), 47-68. External link

Hamad, G. B., Ait Mohamed, O., & Savaria, Y. (2017). Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits. Journal of Electronic Testing: Theory and Applications, 33(5), 607-620. External link

Hoque, K. A., Ait Mohamed, O., Savaria, Y., & Thibeault, C. (2013, October). Early analysis of soft error effects for aerospace applications using probabilistic model checking [Paper]. 2nd International Workshop of Formal Techniques for Safety-Critical Systems (FTSCS 2013), Queenstown, New Zealand. External link

K

Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017, June). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Paper]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. External link

List generated on: Tue Feb 27 09:05:55 2024 EST