Dependability modeling and optimization of triple modular redundancy partitioning for SRAM-based FPGAs

Khaza Anuarul Hoque, Otmane Ait Mohamed and Yvon Savaria

Article (2019)

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Department:	Department of Electrical Engineering
Research Center:	GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL:	https://publications.polymtl.ca/41258/
Journal Title:	Reliability Engineering and System Safety (vol. 182)
Publisher:	Elsevier
DOI:	10.1016/j.ress.2018.10.011
Official URL:	https://doi.org/10.1016/j.ress.2018.10.011
Date Deposited:	18 Apr 2023 15:02
Last Modified:	25 Sep 2024 16:27

Cite in APA 7:	Hoque, K. A., Ait Mohamed, O., & Savaria, Y. (2019). Dependability modeling and optimization of triple modular redundancy partitioning for SRAM-based FPGAs. Reliability Engineering and System Safety, 182, 107-119. https://doi.org/10.1016/j.ress.2018.10.011
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