Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits

Ghaith Bany Hamad, Otmane Ait Mohamed and Yvon Savaria

Article (2017)

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Department:	Department of Electrical Engineering
Research Center:	GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL:	https://publications.polymtl.ca/38638/
Journal Title:	Journal of Electronic Testing: Theory and Applications (vol. 33, no. 5)
Publisher:	Springer
DOI:	10.1007/s10836-017-5682-9
Official URL:	https://doi.org/10.1007/s10836-017-5682-9
Date Deposited:	18 Apr 2023 15:04
Last Modified:	08 Apr 2025 07:01

Cite in APA 7:	Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017). Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits. Journal of Electronic Testing: Theory and Applications, 33(5), 607-620. https://doi.org/10.1007/s10836-017-5682-9
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