Ghaith Bany Hamad, Otmane Ait Mohamed, Syed Rafay Hasan and Yvon Savaria
Paper (2012)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9781467302197 |
| PolyPublie URL: | https://publications.polymtl.ca/15839/ |
| Conference Title: | IEEE International Symposium on Circuits and Systems (ISCAS 2012) |
| Conference Location: | Seoul, Korea, Republic of |
| Conference Date(s): | 2012-05-20 - 2012-05-23 |
| Publisher: | IEEE |
| DOI: | 10.1109/iscas.2012.6272020 |
| Official URL: | https://doi.org/10.1109/iscas.2012.6272020 |
| Date Deposited: | 18 Apr 2023 15:10 |
| Last Modified: | 08 Apr 2025 12:19 |
| Cite in APA 7: | Bany Hamad, G., Ait Mohamed, O., Rafay Hasan, S., & Savaria, Y. (2012, May). Identification of soft error glitch-propagation paths: Leveraging SAT solvers [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2012), Seoul, Korea, Republic of. https://doi.org/10.1109/iscas.2012.6272020 |
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