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Documents dont l'auteur est "Bany Hamad, Ghaith"

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Nombre de documents: 7

Bany Hamad, G. (2017). Multilevel Modeling, Formal Analysis, and Characterization of Single Event Transients Propagation in Digital Systems [Thèse de doctorat, École Polytechnique de Montréal]. Disponible

Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (juin 2017). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Communication écrite]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. Lien externe

Bany Hamad, G., Kazma, G., Mohamed, O. A., & Savaria, Y. (novembre 2016). Efficient and accurate analysis of single event transients propagation using SMT-based techniques [Communication écrite]. 35th International Conference on Computer-Aided Design (ICCAD 2016), Austin, TX (7 pages). Lien externe

Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (septembre 2016). SMT-based reliability-aware synthesis for single event transients tolerant combinational circuits [Affiche]. Radiation Effects on Components & Systems Conference (RADECS 2016), Bremen, Germany. Non disponible

Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2014). New insights into the single event transient propagation through static and TSPC logic. IEEE Transactions on Nuclear Science, 61(4), 1618-1627. Lien externe

Bany Hamad, G., Ait Mohamed, O., Rafay Hasan, S., & Savaria, Y. (mai 2012). Identification of soft error glitch-propagation paths: Leveraging SAT solvers [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2012), Seoul, Korea, Republic of. Lien externe

Bany Hamad, G., Mohamed, O. A., Hasan, S. R., & Savaria, Y. (décembre 2011). SEGP-finder: Tool for identification of soft error glitch-propagating paths at gate level [Communication écrite]. 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Beirut, Lebanon. Lien externe

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