Ghaith Bany Hamad, S. R. Hasan, O. A. Mohamed and Yvon Savaria
Article (2015)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/34148/ |
| Journal Title: | Microelectronics Reliability (vol. 55, no. 1) |
| Publisher: | Elsevier |
| DOI: | 10.1016/j.microrel.2014.09.025 |
| Official URL: | https://doi.org/10.1016/j.microrel.2014.09.025 |
| Date Deposited: | 18 Apr 2023 15:06 |
| Last Modified: | 08 Apr 2025 06:55 |
| Cite in APA 7: | Bany Hamad, G., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2015). Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits. Microelectronics Reliability, 55(1), 238-250. https://doi.org/10.1016/j.microrel.2014.09.025 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
