<  Retour au portail Polytechnique Montréal

Documents dont l'auteur est "Amassian, A."

Monter d'un niveau
Pour citer ou exporter [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Nombre de documents: 19

Dudek, M., Amassian, A., Zabeida, O., Sapieha, J.-E., & Martinu, L. (2009). Ion bombardment-induced enhancement of the properties of indium tin oxide films prepared by plasma-assisted reactive magnetron sputtering. Thin Solid Films, 517(16), 4576-4582. Lien externe

Amassian, A., Dudek, M., Zabeida, O., Gujrathi, S. C., Sapieha, J.-E., & Martinu, L. (2009). Oxygen incorporation and charge donor activation via subplantation during growth of indium tin oxide films. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 27(2), 362-366. Lien externe

Amassian, A., Svec, M., Desjardins, P., & Martinu, L. (2006). Dynamics of ion bombardment-induced modifications of Si(001) at the radio-frequency-biased electrode in low-pressure oxygen plasmas: in situ spectroscopic ellipsometry and Monte Carlo study. Journal of Applied Physics, 100(6), 063526. Lien externe

Amassian, A., Svec, M., Desjardins, P., & Martinu, L. (2006). Interface broadening due to ion mixing during thin film growth at the radio-frequency-biased electrode in a plasma-enhanced chemical vapor deposition environment. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 24(6), 2061-2069. Lien externe

Vernhes, R., Amassian, A., Sapieha, J.-E., & Martinu, L. (2006). Plasma treatment of porous SiNₓ:H films for the fabrication of porous-dense multilayer optical filters with tailored interfaces. Journal of Applied Physics, 99(11), 114315.1-114315.12. Lien externe

Jedrzejowski, P., Amassian, A., Bousser, E., Sapieha, J.-E., & Martinu, L. (2006). Real-time in situ growth study of TiN- and TiCₓNy-based superhard nanocomposite coatings using spectroscopic ellipsometry. Applied Physics Letters, 88(7), 71915-1. Lien externe

Martinu, L., Masse, J.-P., Szymanowski, H., Zabeida, O., Amassian, A., & Sapieha, J.-E. (2006). Stability and effect of annealing on the optical properties of plasma-deposited Ta₂O₅ and Nb₂O₅ films. Thin Solid Films, 515(4), 1674-1682. Lien externe

Tabbal, M., Christidis, T., Isber, S., Merel, P., El-Khakani, M. A., Chaker, M., Amassian, A., & Martinu, L. (2005). Correlation between the sp²-phase nanostructure and the physical properties of unhydrogenated carbon nitride. Journal of Applied Physics, 98(4). Lien externe

Jedrzejowski, P., Amassian, A., Bousser, E., Martinu, L., & Sapieha, J.-E. (avril 2005). Growth study of TiN and superhard nanocompostie c-TiN/Si₃N₄ and c-TiCN/a-SiCN coatings using in situ ellipsometry [Communication écrite]. 48th Society of Vacuum Coaters Technical Conference, Denver, Colorado. Non disponible

Gaidi, M., Stafford, L., Amassian, A., Chaker, M., Margot, J., Martinu, L., & Kulishov, M. (2005). Influence of the Microstructure on the Optical Characteristics of SrTiO₃ Thin Films. Journal of Materials Research, 20(1), 68-74. Lien externe

Amassian, A., Verhnes, R., Sapieha, J.-E., Desjardins, P., & Martinu, L. (2004). Interface engineering during plasma-enhances chemical vapor deposition of porous/dense SiN1.3 optical multilayers. Thin Solid Films, 469-470, 47-53. Lien externe

Amassian, A., Vernhes, R., Sapieha, J.-E., Desjardins, P., & Martinu, L. (janvier 2004). Interface engineering of porous/dense multilayers of SiN1.3: in situ real-time spectroscopic ellipsometry study [Communication écrite]. 47th Society of Vacuum Coaters Technical Conference. Lien externe

Jedrzejowski, P., Cizek, J., Amassian, A., Sapieha, J.-E., Vlcek, J., & Martinu, L. (2004). Mechanical and optical properties of hard SiCN coatings prepared by PECVD. Thin Solid Films, 447-448, 201-207. Lien externe

Gaidi, M., Amassian, A., Chaker, M., Kulishov, M., & Martinu, L. (2004). Pulsed Laser Deposition of Plzt Films: Structural and Optical Characterization. Applied Surface Science, 226(4), 347-354. Lien externe

Amassian, A., Desjardins, P., & Martinu, L. (2004). Study of TiO₂ film growth mechanisms in low-pressure plasma by in situ real-time spectroscopic ellipsometry. Thin Solid Films, 447-448(3), 40-45. Lien externe

Amassian, A., Larouche, S., Vernhes, R., Sapieha, J.-E., Desjardins, P., & Martinu, L. (mai 2002). Analysis and control of optical film growth by in situ real-time spectroscopic ellipsometry [Communication écrite]. SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging (Opto Canada 2002), Ottawa, Ont., Can.. Lien externe

Amassian, A., Larouche, S., Sapieha, J.-E., Desjardins, P., & Martinu, L. (avril 2002). In situ ellipsometric study of the initial growth stages of a TiO₂ by PECVD [Communication écrite]. 45th Annual Technical Conference of the Society of Vacuum Coaters, Lake Buena Vista, FL, USA. Lien externe

Larouche, S., Amassian, A., Gujrathi, S. C., Sapieha, J.-E., & Martinu, L. (janvier 2001). Multilayer and inhomogeneous optical filters fabricated by PECVD using titanium dioxide and silicon dioxide [Communication écrite]. 44th Annual Technical Conference, Philadelphia, PA, United States. Non disponible

Zabeida, O., Amassian, A., Larouche, S., Lavigne, C., Sapieha, J.-E., Martinu, L., Morton, D. E., Stevenson, I. C., & Zimone, F. (juillet 2001). Plasma deposition of anti-reflective coatings on spherical lenses [Communication écrite]. Optical Interference Coatings (OIC 2001), Banff, AB, Canada. Lien externe

Liste produite: Tue Nov 19 03:30:11 2024 EST.