Documents dont l'auteur est "Bassetto, Samuel"

Samuel BassettoDépartement de mathématiques et de génie industrielVoir sa fiche dans le Répertoire des Expertises de Polytechnique Montréal

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Alencar de Paula, R., Mosbah, A. B., Chinniah, Y. A., & Bassetto, S. (2022). Towards a New Continuous Improvement Organization Based on Simulation. Engineering Management Journal, 34(4), 559-573. Lien externe

Armellini, F., Pelicioni, R. A., Kaminski, P. C., & Bassetto, S. (2017). Including the voice of the client in the creative process: a case study of the integration of Quality Function Deployment (QFD) to the Value Proposition Design (VPD) in the service sector. Journal of Modern Project Management, 5(2). Lien externe

Agard, B., & Bassetto, S. (2013). Modular design of product families for quality and cost. International Journal of Production Research, 51(6), 1648-1667. Lien externe

Agard, B., & Bassetto, S. (mars 2012). Modular design for quality and cost [Communication écrite]. 6th IEEE International Systems Conference (SysCon 2012), Vancouver, BC, Canada. Lien externe

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Bassetto, S., Yacout, S., Bassetto, S., & Shaban, Y. (2023). Experimental vibration data collected for a belt drive system under different operating conditions. Data in Brief, 48, 6 pages. Disponible

Bettayeb, B., & Bassetto, S. (2016). Impact of type-II inspection errors on a risk exposure control approach based quality inspection plan. Journal of Manufacturing Systems, 40, 87-95. Lien externe

Baud-Lavigne, B., Bassetto, S., & Agard, B. (2016). A method for a robust optimization of joint product and supply chain design. Journal of Intelligent Manufacturing, 27(4), 741-749. Lien externe

Brunetto, F., Peuch, J., & Bassetto, S. (avril 2015). System risk analysis enhanced with system graph properties [Communication écrite]. 9th Annual IEEE International Systems Conference (SysCon 2015), Vancouver, BC. Lien externe

Bettayeb, B., & Bassetto, S. (mars 2014). Effects of process learning and product lifecycle on risk-based quality control plans [Communication écrite]. 8th annual IEEE International Systems Conference on Systems Conference (SysCon 2014), Ottawa, ON. Lien externe

Bettayeb, B., Bassetto, S., & Sahnoun, M. (2014). Quality control planning to prevent excessive scrap production. Journal of Manufacturing Systems, 33(3), 400-411. Lien externe

Bassetto, S., Paredes, C., & Baud-Lavigne, B. (avril 2013). A systemic approach of quality controls [Communication écrite]. 7th Annual IEEE Systems Conference (SysCon 2013), Orlando, Fl, USA. Lien externe

Bassetto, S., Cholez, C., Mangione, F., & Fiegenwald, V. (2012). Experiencing production ramp-up education for engineers. European Journal of Engineering Education, 37(6), 652-654. Lien externe

Bettayeb, B., Bassetto, S., Vialletelle, P., & Tollenaere, M. (2012). Quality and exposure control in semiconductor manufacturing. Part I: Modelling. International Journal of Production Research, 50(23), 6835-6851. Lien externe

Bettayeb, B., Bassetto, S., Vialletelle, P., & Tollenaere, M. (2012). Quality and exposure control in semiconductor manufacturing. Part II: Evaluation. International Journal of Production Research, 50(23), 6852-6869. Lien externe

Bassetto, S., Siadat, A., & Tollenaere, M. (2011). The management of process control deployment using interactions in risks analyses. Journal of Loss Prevention in the Process Industries, 24(4), 458-465. Lien externe

Bettayeb, B., Tollenaere, M., & Bassetto, S. (octobre 2011). Plan de surveillance basé sur l'exposition aux risques et les capabilités des ressources [Communication écrite]. 9e Congrès international de génie industriel (CIGI 2011), Saint-Sauveur, Québec. Non disponible

Baud-Lavigne, B., Bassetto, S., & Penz, B. (2010). A broder view of control chart economic design. International Journal of Production Research, 48(19), 5843-5857. Lien externe

Bettayeb, B., Vialletelle, P., Bassetto, S., & Tollenaere, M. (novembre 2010). Operational risk evaluation and control plan design [Communication écrite]. 13th ARCSIS Technical & Scientific Meeting, Manufacturing Challenges in European Semiconductor Fabs, Rousset, France. Non disponible

Bettayeb, B., Vialletelle, P., Bassetto, S., & Tollenaere, M. (octobre 2010). Optimized design of control plans based on risk exposure and ressources capabilites [Communication écrite]. International Symposium on Semiconductor Manufacturing (ISSM 2010), Tokyo. Japan. Lien externe

Bassetto, S., & Siadat, A. (2009). Operational methods for improving manufacturing control plans: case study in a semiconductor industry. Journal of Intelligent Manufacturing, 20(1), 55-65. Lien externe

Bassetto, S., Mili, A., Siadat, A., & Tollenaere, M. (juin 2007). Proposition d'organisation du retour d'expériences par la gestion des risques pour faciliter l'industrialisation [Communication écrite]. 7e Congrès international de génie industriel (CIGI 2007), Trois-Rivières, Québec. Non disponible

Bassetto, S., Mili, A., & Siadat, A. (décembre 2007). Speeding-up experiences return during new productions industrialization [Communication écrite]. IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2007), Singapore. Lien externe

Bassetto, S., Siadat, A., & Martin, P. (juillet 2006). A collaborative problem resolution tool based on experts knowledge acquisition, using term classification [Communication écrite]. 5th CIRP International Seminar on Intelligent Computation in Manufacturing Engineering (CIRP ICME 2006), Ischia, Italy. Non disponible

Bassetto, S., Siadat, A., Vernadat, F., & Martin, P. (mai 2006). Enterprise model for integrating process control into CAM system [Communication écrite]. 12th IFAC Symposium on Information Control Problems in Manufacturing (INCOM 2006), Saint-Étienne, France. Lien externe

Bassetto, S., Siadat, A., & Martin, P. (2006). Études des interactions entre les risques des moyens de production : introduction à l'utilisation du concept de typologie des risques. Journal Européen des Systèmes Automatisés, 40(6), 571. Non disponible

Bassetto, S., Siadat, A., & Martin, P. (2006). Interactions entre les risques des produits, des processus de fabrication, des ressources par l'utilisation du concept de typologie. Application à une usine de recherche et de production de semi-conducteurs. [Mastering process control using risks typologies]. Journal Européen des Systèmes Automatisés, 40(6), 571-591. Lien externe

Bassetto, S., & Siadat, A. (mars 2006). Vers une définition de la notion de connaissance, application à la gestion des risques opérationnels [Communication écrite]. GDR MACS Conference, Paris, France. Non disponible

Bassetto, S. (2005). Contribution à la qualification et à l'amélioration des moyens de production, de manière opérationnelle, dynamique, en supportant les connaissances métier [Toward a dynamic, operational and "embeded knowledge" manufacturing improvement]. [Thèse de doctorat, Arts et Métiers ParisTech - École Nationale Supérieure d'Arts et Métiers]. Lien externe

Bassetto, S. (octobre 2004). Contribution au développement de la méthodologie de process control d'une unité de Recherche et Production de circuits semi-conducteurs. Application à la gestion des risques en zone de fabrication et à la maîtrise de l'environnement de fabrication [Communication écrite]. GRD MACS Conference, Aix-en-Provence, France. Lien externe

Bassetto, S., Siadat, A., & Martin, P. (juin 2004). A knowledge management framework, applied to relevant information discovery and reuse : Balancing knowledge and technology in product and service life cycle [Communication écrite]. 4th CIRP International Seminar on Intelligent Computation in Manufacturing Engineering (CIRP ICME 2004), Sorrento, Italy. Lien externe

Bassetto, S., Hubac, S., Siadat, A., & Martin, P. (2004). Méthode outillée employant les connaissances d'experts. Revue française de gestion industrielle, 24(1), 1-13. Lien externe

Bassetto, S., Hubac, S., Siadat, A., & Martin, P. (novembre 2004). A tooled methodology to reduce operational risks [Communication écrite]. IEEE International Conference on Advances in Intelligent Systems - Theory and Applications (IEEE-AISTA), Luxembourg, Netherlands. Non disponible

Bassetto, S. (janvier 2004). L'utilisation des connaissances contenues dans les AMDEC produit - process - machine, dans une usine de semi-conducteurs [Communication écrite]. I-KM journée du 151, Paris, France. Non disponible

Bassetto, S. (mars 2003). Designing and prototyping a prospective knowledge discovery and reuse system for process control engineers [Communication écrite]. 4th European Advanced Equipment Control/Advanced Process Control Conference (AEC/APC 2003), Grenoble, France. Non disponible

Bassetto, S., Siadat, A., & Martin, P. (juin 2004). Advanced process control application modelling [Communication écrite]. 4th CIRP International Seminar on Intelligent Computation in Manufacturing Engineering (CIRP ICME 2004), Ischia, Italy. Non disponible

Bassetto, S., Siadat, A., & Martin, P. (2002). Introduction to the prototyping of an intelligent supervision system. Dans Knowledge and Technology Integration in Production and Services : Balancing Knowledge and Technology in Product and Service Life Cycle (p. 427-436). Lien externe

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Coatanéa, É., Nagarajan, H., Mokhtarian, H., Wu, D., Panicker, S., Morales-Forero, A., & Bassetto, S. (2023). Graph models for engineering design: Model encoding, and fidelity evaluation based on dataset and other sources of knowledge. AI EDAM, 37. Lien externe

Cabour, G., Ledoux, E., & Bassetto, S. (2022). Aligning work analysis and modeling with the engineering goals of a Cyber-Physical-Social System for industrial inspection. Applied Ergonomics, 102, 16 pages. Lien externe

Cabour, G., Morales-Forero, A., Ledoux, E., & Bassetto, S. (2022). An explanation space to align user studies with the technical development of Explainable AI. AI and Society, 38(2), 869-887. Lien externe

Cabour, G., Ledoux, É., & Bassetto, S. (juin 2021). Extending System Performance Past the Boundaries of Technical Maturity: Human-Agent Teamwork Perspective for Industrial Inspection [Communication écrite]. 21st Congress of the International Ergonomics Association (IEA 2021). Lien externe

Charron-Latour, J., Bassetto, S., & Pourmonet, H. (2017). STARS: the implementation of a computer-aided employee suggestion management system to operationalize a continuous improvement process. Cognition, Technology & Work, 19(1), 179-190. Lien externe

Charron-Latour, J., DePaula, R., & Bassetto, S. (mai 2015). Amélioration continue par le personnel, du besoin à la réalité [Communication écrite]. Congrès Mondial des infirmières et infirmiers francophones, Montréal, Québec. Non disponible

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Dubé, E., Lorcy, A., Audy, N., Desmarais, N., Savard, P., Soucy, C., Bassetto, S., Rajon, M., Brunet, F., Barbir, C., & Quach, C. (2019). Adoption of infection prevention and control practices by healthcare workers in Québec: A qualitative study. Infection Control & Hospital Epidemiology, 40(12), 1361-1366. Lien externe

de Paula, R., Dimas, E., Laroche, C., & Bassetto, S. (avril 2019). Measuring the dynamic engagement with a system of equations - theory demonstration and initial analysis [Communication écrite]. IEEE International Systems Conference (SysCon 2019), Orlando, Florida (7 pages). Lien externe

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Elbadiry, A. H., Bassetto, S., & Ouali, M.-S. (2016). Study of similarity analysis methods for aviation system failures. IEEE Aerospace and Electronic Systems Magazine, 31(6), 12-22. Lien externe

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Fiegenwald, V., Bassetto, S., & Tollenaere, M. (2014). Controlling non-conformities propagation in manufacturing. International Journal of Production Research, 52(14), 4118-4131. Lien externe

Fiegenwald, V., Bassetto, S., & Tollenaere, M. (décembre 2011). Controlling non-conformities propagation in manufacturing. Case study in an electromechanical assembly plant [Communication écrite]. IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2011), Singapore, Singapore. Lien externe

Fiegenwald, V., Bassetto, S., & Tollenaere, M. (octobre 2011). Vers la maîtrise de la propagation des non-conformités en fabrication : cas d'étude dans une usine d'assemblage électromécanique [Communication écrite]. 9e Congrès international de génie industriel (CIGI 2011), Saint-Sauveur, Québec. Non disponible

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Khalifa, R. M., Yacout, S., Bassetto, S., & Shaban, Y. (2024). Condition monitoring and warning of a belt drive system based on a logical analysis of data regression-based residual control chart. Structural Health Monitoring. Lien externe

Khalifa, R. M., Yacout, S., & Bassetto, S. (2023). Root cause analysis of an out-of-control process using a logical analysis of data regression model and exponential weighted moving average. Journal of Intelligent Manufacturing, 16 pages. Lien externe

Khalifa, R. M., Yacout, S., & Bassetto, S. (2021). Developing machine-learning regression model with Logical Analysis of Data (LAD). Computers and Industrial Engineering, 151, 106947 (16 pages). Lien externe

Khalifa, R. M., Yacout, S., & Bassetto, S. (novembre 2021). Quality 4.0 : entity relationship model for inspection and repair processes in aerospace domain [Communication écrite]. 6th North American Conference on Industrial Engineering & Operations Management (IEOM 2021), Monterrey, Mexico (11 pages). Lien externe

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Morales-Forero, A., Jaime, L. R., Gil‐Quiñones, S. R., Montañez, M. Y. B., Bassetto, S., & Coatanéa, É. (2024). An insight into racial bias in dermoscopy repositories: A HAM10000 data set analysis. JEADV Clinical Practice, 477 (8 pages). Disponible

Morales-Forero, A., Bassetto, S., & Coatanéa, É. (2022). Toward safe AI. AI & SOCIETY, 38(2), 12 pages. Lien externe

Morales-Forero, A., & Bassetto, S. (décembre 2019). Case Study: A Semi-Supervised Methodology for Anomaly Detection and Diagnosis [Communication écrite]. IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2019), Macao. Lien externe

Motte, A., & Bassetto, S. (décembre 2012). Product driven quality control [Communication écrite]. IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2012), Hong Kong, China. Lien externe

Mili, A., Siadat, A., Bassetto, S., Hubac, S., & Tollenaere, M. (mars 2009). Unified process for action plan management: Case study in a research and production semiconductor factory [Communication écrite]. 3rd Annual IEEE Systems Systems Conference, Vancouver, British Columbia. Lien externe

Mili, A., Siadat, A., Bassetto, S., Hubac, S., & Tollenaere, M. (2010). Unified process for action plan management: Case study in a research and production semiconductor factory. IEEE Aerospace and Electronic Systems Magazine, 25(6), 4-8. Lien externe

Mili, A., Bassetto, S., Siadat, A., & Tollenaere, M. (2009). Dynamic risk management unveil productivity improvements. Journal of Loss Prevention in the Process Industries, 22(1), 25-34. Lien externe

Mili, A., Hubac, S., Siadat, A., & Bassetto, S. (septembre 2008). Dynamic management of detected factory events and estimated risks using FMECA [Communication écrite]. 4th IEEE International Conference Management of Innovation and Technology (ICMT 2008), Bangkok, Thailand. Lien externe

Mili, A., & Bassetto, S. (juillet 2008). New approach for risk analysis update based on maintenance events [Communication écrite]. 17th IFAC World Congress, Seoul, Korea. Lien externe

Mili, A., Hubac, S., Bassetto, S., & Siadat, A. (juillet 2008). Risks analyses update based on maintenance events [Communication écrite]. 17th IFAC World Congress, Korea, South. Lien externe

Mili, A., Hubac, S., Siadat, A., & Bassetto, S. (septembre 2008). Unified action plan management based on risk analysis and relevant information approaches [Communication écrite]. 4th IEEE International Conference on Management of Innovation and Technology (ICMIT 2008), Bangkok, Thailand (6 pages). Lien externe

Mili, A., Hubac, S., & Bassetto, S. (avril 2007). Industrialization of risk analysis method [Communication écrite]. 8th European Advanced Equipment Control/Advanced Process Control Conference (AEC/APC 2007), Dresden, Germany. Non disponible

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Nebas, M., & Bassetto, S. (juillet 2014). Data management system in clean room environment [Communication écrite]. 2nd annual MIT App Inventor Summit, Boston, MA. Non disponible

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Petronijevic, J., Etienne, A., Bassetto, S., & Siadat, A. (2023). The missing link between project and product risk management: From the review to the call to action. Journal of Engineering and Technology Management, 69, 101770 (17 pages). Lien externe

Picci, L., Mosbah, A. B., & Bassetto, S. (décembre 2019). A Decision Tool for Quality System Improvement [Communication écrite]. IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2019), Macao, Macao. Lien externe

Petronijevic, J., Etienne, A., Siadat, A., & Bassetto, S. (septembre 2019). Operational framework for managing risk interactions in product development projects [Communication écrite]. International Conference on Industrial Engineering and Systems Management (IESM 2019), Shanghai, China (6 pages). Lien externe

Pourmonet, H., Bassetto, S., & Trépanier, M. (octobre 2015). Vers la maîtrise de l'évasion tarifaire dans un réseau de transport collectif [Communication écrite]. 11e Congrès International de Génie Industriel (CIGI2015), Québec, Canada. Lien externe

Pourmonet, H., Charron-Latour, J., & Bassetto, S. (juillet 2014). App inventor to boost continuous improvement [Communication écrite]. 2nd annual MIT App Inventor Summit, Boston, MA. Non disponible

Partovi Nia, V., Asgharian, M., & Bassetto, S. (août 2013). A format test for binary R&R measurement systems [Communication écrite]. Joint Statistical Meetings, SCC Section, Montréal, Québec. Lien externe

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Restrepo, D., Charron-Latour, J., Pourmonet, H., & Bassetto, S. (2016). Seizing opportunities for change at the operational level. International Journal of Health Care Quality Assurance, 29(3), 253-266. Lien externe

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Sakr, A. H., Aboelhassan, A., Yacout, S., & Bassetto, S. (septembre 2021). Building Discrete-Event Simulation for Digital Twin Applications in Production Systems [Communication écrite]. 26th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2021), Vasteras, Sweden (8 pages). Lien externe

Sakr, A. H., Aboelhassan, A., Yacout, S., & Bassetto, S. (2021). Simulation and deep reinforcement learning for adaptive dispatching in semiconductor manufacturing systems. Journal of Intelligent Manufacturing, 2021(3), 1311-1324. Lien externe

Sakr, A. H., Yacout, S., & Bassetto, S. (octobre 2019). A discrete event simulation logic for semiconductor production planning and control within industry 4.0 paradigm [Communication écrite]. 4th North American International Conference on Industrial Engineering and Operations Management, Toronto, ON (11 pages). Lien externe

Sahnoun, M. , Bettayeb, B., Bassetto, S., & Tollenaere, M. (2014). Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. Journal of Intelligent Manufacturing, 27(6), 1335-1349. Lien externe

Sahnoun, M. , Bettayeb, B., Tollenaere, M., & Bassetto, S. (mars 2012). Smart sampling for risk reduction and delay optimisation [Communication écrite]. IEEE International Systems Conference, Vancouver, BC, Canada. Lien externe

Shanoun, M., Bassetto, S., Bastoini, S., & Vialetelle, P. (2011). Optimization of the process control in a semiconductor company, model and case study of defectivity sampling. International Journal of Production Research, 49(13), 3873-3890. Lien externe

Shanoun, M. , Vialletelle, P., & Bassetto, S. (novembre 2010). A dynamic sampling algorithm [Communication écrite]. 13th ARCSIS Technical & Scientific Meeting, Manufacturing Challenges in European Semiconductor Fabs, Rousset, France. Non disponible

Sahnoun, M. , Vialletelle, P., Bassetto, S., Tollenaere, M., & Bastoini, S. (novembre 2010). Historical wafer-at-risk construction in STMicroelectronics 300mm wafer fab in crollesoptimizing return on inspection through defectivity smart skipping [Communication écrite]. Manufacturing Challenges in European Semiconductor Fabs, Rousset, France. Non disponible

Sahnoun, M., Vialletelle, P., Bastoini, S., Bassetto, S., & Tollenaere, M. (octobre 2010). Optimized return on inspection through smart-sampling [Communication écrite]. International Symposium on Semiconductor Manufacturing (ISSM 2010), Tokyo, Japan. Lien externe

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Tadja, D. D., Bassetto, S., Tollenaere, M., & Wong, T. (2021). Les objets connectés pour améliorer la culture de la production épurée : revue de littérature et esquisse de solution applicable aux entreprises manufacturières. [Industrial Internet of Things to improve lean manufacturing culture: literature review and solution outline for manufacturing plants]. Génie industriel et productique, 4(1), 35 pages. Lien externe

Tilouche, S., Partovi Nia, V., & Bassetto, S. (2021). Parallel coordinate order for high-dimensional data. Statistical Analysis and Data Mining, 14(5), 501-515. Lien externe

Tamrin, M. O., Henwood, S., Dubois, J.-F., Brault, J.-J., Chidami, S., & Bassetto, S. (juin 2019). Using deep learning approaches to overcome limited dataset issues within semiconductor domain [Communication écrite]. 17th IEEE International New Circuits and Systems Conference (NEWCAS 2019), Munich, Germany (4 pages). Lien externe

Tilouche, S., Bassetto, S., & Partovi Nia, V. (septembre 2014). Classification algorithms for virtual metrology [Communication écrite]. IEEE International Conference on Management of Innovation and Technology (ICMIT 2014), Singapore, Singapore. Lien externe