Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing

M. 'hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto and Michel Tollenaere

Article (2014)

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Department:	Department of Mathematics and Industrial Engineering
PolyPublie URL:	https://publications.polymtl.ca/11636/
Journal Title:	Journal of Intelligent Manufacturing (vol. 27, no. 6)
Publisher:	Springer
DOI:	10.1007/s10845-014-0956-x
Official URL:	https://doi.org/10.1007/s10845-014-0956-x
Date Deposited:	18 Apr 2023 15:08
Last Modified:	05 Apr 2024 10:50

Cite in APA 7:	Sahnoun, M. , Bettayeb, B., Bassetto, S., & Tollenaere, M. (2014). Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. Journal of Intelligent Manufacturing, 27(6), 1335-1349. https://doi.org/10.1007/s10845-014-0956-x
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