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Bettayeb, B., Bassetto, S., Vialletelle, P., & Tollenaere, M. (2012). Quality and exposure control in semiconductor manufacturing. Part I: Modelling. International Journal of Production Research, 50(23), 6835-6851. External link
Bettayeb, B., Bassetto, S., Vialletelle, P., & Tollenaere, M. (2012). Quality and exposure control in semiconductor manufacturing. Part II: Evaluation. International Journal of Production Research, 50(23), 6852-6869. External link
Bassetto, S., Siadat, A., & Tollenaere, M. (2011). The management of process control deployment using interactions in risks analyses. Journal of Loss Prevention in the Process Industries, 24(4), 458-465. External link
Bettayeb, B., Tollenaere, M., & Bassetto, S. (2011, October). Plan de surveillance basé sur l'exposition aux risques et les capabilités des ressources [Paper]. 9e Congrès international de génie industriel (CIGI 2011), Saint-Sauveur, Québec. Unavailable
Bettayeb, B., Vialletelle, P., Bassetto, S., & Tollenaere, M. (2010, November). Operational risk evaluation and control plan design [Paper]. 13th ARCSIS Technical & Scientific Meeting, Manufacturing Challenges in European Semiconductor Fabs, Rousset, France. Unavailable
Bettayeb, B., Vialletelle, P., Bassetto, S., & Tollenaere, M. (2010, October). Optimized design of control plans based on risk exposure and ressources capabilites [Paper]. International Symposium on Semiconductor Manufacturing (ISSM 2010), Tokyo. Japan. External link
Bassetto, S., Mili, A., Siadat, A., & Tollenaere, M. (2007, June). Proposition d'organisation du retour d'expériences par la gestion des risques pour faciliter l'industrialisation [Paper]. 7e Congrès international de génie industriel (CIGI 2007), Trois-Rivières, Québec. Unavailable
Fiegenwald, V., Bassetto, S., & Tollenaere, M. (2011, October). Vers la maîtrise de la propagation des non-conformités en fabrication : cas d'étude dans une usine d'assemblage électromécanique [Paper]. 9e Congrès international de génie industriel (CIGI 2011), Saint-Sauveur, Québec. Unavailable
Sahnoun, M. , Bettayeb, B., Bassetto, S., & Tollenaere, M. (2014). Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. Journal of Intelligent Manufacturing, 27(6), 1335-1349. External link
Sahnoun, M. , Bettayeb, B., Tollenaere, M., & Bassetto, S. (2012, March). Smart sampling for risk reduction and delay optimisation [Paper]. IEEE International Systems Conference, Vancouver, BC, Canada. External link
Sahnoun, M. , Vialletelle, P., Bassetto, S., Tollenaere, M., & Bastoini, S. (2010, November). Historical wafer-at-risk construction in STMicroelectronics 300mm wafer fab in crollesoptimizing return on inspection through defectivity smart skipping [Paper]. Manufacturing Challenges in European Semiconductor Fabs, Rousset, France. Unavailable
Sahnoun, M., Vialletelle, P., Bastoini, S., Bassetto, S., & Tollenaere, M. (2010, October). Optimized return on inspection through smart-sampling [Paper]. International Symposium on Semiconductor Manufacturing (ISSM 2010), Tokyo, Japan. External link
Tadja, D. D., Bassetto, S., Tollenaere, M., & Wong, T. (2021). Les objets connectés pour améliorer la culture de la production épurée : revue de littérature et esquisse de solution applicable aux entreprises manufacturières. [Industrial Internet of Things to improve lean manufacturing culture: literature review and solution outline for manufacturing plants]. Génie industriel et productique, 4(1), 35 pages. External link
