Mhamed Sahnoun, Philippe Vialletelle, Soidri Bastoini, Samuel Bassetto
and Michel Tollenaere
Paper (2010)
Document published while its authors were not affiliated with Polytechnique Montréal
An external link is available for this item
| PolyPublie URL: | https://publications.polymtl.ca/17657/ |
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| Conference Title: | International Symposium on Semiconductor Manufacturing (ISSM 2010) |
| Conference Location: | Tokyo, Japan |
| Conference Date(s): | 2010-10-18 - 2010-10-20 |
| Publisher: | IEEE |
| Official URL: | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&ar... |
| Date Deposited: | 18 Apr 2023 15:14 |
| Last Modified: | 08 Jun 2023 11:25 |
| Cite in APA 7: | Sahnoun, M., Vialletelle, P., Bastoini, S., Bassetto, S., & Tollenaere, M. (2010, October). Optimized return on inspection through smart-sampling [Paper]. International Symposium on Semiconductor Manufacturing (ISSM 2010), Tokyo, Japan. https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5750233&isnumber=5750172 |
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