F. Brunetto, J. Peuch and Samuel Bassetto
Paper (2015)
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| Department: | Department of Mathematics and Industrial Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/11270/ |
| Conference Title: | 9th Annual IEEE International Systems Conference (SysCon 2015) |
| Conference Location: | Vancouver, BC |
| Conference Date(s): | 2015-04-13 - 2015-04-16 |
| Publisher: | IEEE |
| DOI: | 10.1109/syscon.2015.7116766 |
| Official URL: | https://doi.org/10.1109/syscon.2015.7116766 |
| Date Deposited: | 18 Apr 2023 15:06 |
| Last Modified: | 05 Apr 2024 10:49 |
| Cite in APA 7: | Brunetto, F., Peuch, J., & Bassetto, S. (2015, April). System risk analysis enhanced with system graph properties [Paper]. 9th Annual IEEE International Systems Conference (SysCon 2015), Vancouver, BC. https://doi.org/10.1109/syscon.2015.7116766 |
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