B. Bettayeb and Samuel Bassetto
Paper (2014)
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| Department: | Department of Mathematics and Industrial Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/12707/ |
| Conference Title: | 8th annual IEEE International Systems Conference on Systems Conference (SysCon 2014) |
| Conference Location: | Ottawa, ON |
| Conference Date(s): | 2014-03-31 - 2014-04-03 |
| Publisher: | IEEE |
| DOI: | 10.1109/syscon.2014.6819303 |
| Official URL: | https://doi.org/10.1109/syscon.2014.6819303 |
| Date Deposited: | 18 Apr 2023 15:07 |
| Last Modified: | 05 Apr 2024 10:52 |
| Cite in APA 7: | Bettayeb, B., & Bassetto, S. (2014, March). Effects of process learning and product lifecycle on risk-based quality control plans [Paper]. 8th annual IEEE International Systems Conference on Systems Conference (SysCon 2014), Ottawa, ON. https://doi.org/10.1109/syscon.2014.6819303 |
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