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Documents dont l'auteur est "Audet, Yves"

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Nombre de documents: 56

A

Altoobaji, I., Hassan, A., Ali, M., Nabavi, M., Audet, Y., & Lakhssassi, A. (2023). A Fully Integrated 0.6 Gbps Data Communication System for Inductive-Based Digital Isolator with 0.8 ns Propagation Delay and 10(-15) BER. Electronics, 12(15), 3336 (15 pages). Lien externe

Altoobaji, I., Hassan, A., Ali, M., Audet, Y., & Lakhssassi, A. (2023). A Low-Power 0.68-Gbps Data Communication System for Capacitive Digital Isolator With 1.9-ns Propagation Delay. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 5 pages. Lien externe

Ali, M., Hassan, A., Honarparvar, M., Nabavi, M., Audet, Y., Sawan, M., & Savaria, Y. (2022). A Versatile SoC/SiP Sensor Interface for Industrial Applications: Implementation Challenges. IEEE Access, 10, 24540-24555. Lien externe

Audet, Y., Bendali, A., & David, J. P. (2021). A CMOS Photodetector for or Direct Color Imaging. IEEE Transactions on Electron Devices, 68(3), 1107-1114. Lien externe

Altoobaji, I., Ali, M., Hassan, A., Audet, Y., & Lakhssassi, A. (juin 2021). A High Speed Fully Integrated Capacitive Digital Isolation System in 0.35 m CMOS for Industrial Sensor Interfaces [Communication écrite]. 19th IEEE International New Circuits and Systems Conference (NEWCAS 2021), Toulon, France (4 pages). Lien externe

Altoobaji, I., Ali, M., Hassan, A., Nabavi, M., Audet, Y., & Lakhssassi, A. (août 2020). A Fully Integrated On-Chip Inductive Digital Isolator: Design Investigation and Simulation [Communication écrite]. 63rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS 2020), Springfield, MA, USA. Lien externe

Audet, Y. (2012). Photodetector for determining light wavelengths. (Brevet no US9634173). Lien externe

Audet, Y. (2012). Wavelength detection based on depth penetration for color image sensing. (Brevet no US8106348). Lien externe

Audet, Y., & Aboutorabi, S. S. (juin 2008). A CMOS process compatible color sensor using wavelength dependent absorption depth [Communication écrite]. Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2008), Montréal, QC, Canada. Lien externe

Audet, Y., Aubray, L., & Blouin, D. (juin 2006). A CMOS Fingerprint Sensor Based on Skin Resistivity [Communication écrite]. 4th IEEE International Northeast Workshop on Circuits and Systems (NEWCAS 2006), Gatineau, Québec. Lien externe

Audet, Y., & Chapman, G. H. (octobre 2001). Design of a self-correcting active pixel sensor [Communication écrite]. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, San Francisco, CA, USA. Lien externe

B

Benhammadi, S., Audet, Y., & Diaconu, V. (juin 2012). A spectro reflectance camera for in vivo human blood evaluation [Communication écrite]. 10th IEEE International New Circuits and Systems Conference (NEWCAS 2012), Montréal, Québec. Lien externe

Beaudoin, P. M., Audet, Y., & Ponce-Ponce, V. H. (juin 2009). Dark current compensation in CMOS image sensors using a differential pixel architecture [Communication écrite]. Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2009), Toulouse, France. Lien externe

Beaudoin, P. M., Audet, Y., & Bendali, A. (2008). Characterizing a Thermoelectric Module as Part of a Semiconductor Course Laboratory. IEEE Transactions on Education, 51(2), 282-287. Lien externe

Bendali, A., & Audet, Y. (2007). A 1-V CMOS Current Reference With Temperature and Process Compensation. IEEE Transactions on Circuits and Systems I: Regular Papers, 54(7), 1424-1429. Lien externe

Boussaa, M., & Audet, Y. (juin 2023). A 1.6 GHz digital DLL for optical clock-distribution [Communication écrite]. 3rd IEEE International Northeast Workshop on Circuits and Systems (NEWCAS 2005), Québec, Québec. Lien externe

Bendali, A., & Audet, Y. (septembre 2004). A 1V high-performance CMOS current reference for application in photoreceiver transimpedance amplifier [Communication écrite]. Photonics North 2004, Ottawa, Canada. Lien externe

Bendali, A., & Audet, Y. (novembre 2004). Low voltage current reference with temperature and process parameter variation compensation [Communication écrite]. IASTED International on Circuits, Signals and Systems, Clearwater, Florida, USA. Lien externe

C

Cheung, D. Y. H., Chapman, G. H., Djaja, S., Audet, Y., Wai, B., & Jung, C. (janvier 2004). Fault tolerant Active Pixel Sensors for large area digital imaging systems [Communication écrite]. Optoelectronic integrated circuits VI, San Jose CA. Lien externe

Chapman, G. H., Djaja, S., Cheung, D. Y. H., Audet, Y., Koren, I., & Koren, Z. (2004). A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Design & Test of Computers, 21(6), 544-551. Lien externe

D

Darvishi, M., Audet, Y., Blaquiere, Y., Thibeault, C., & Pichette, S. (2019). On the susceptibility of SRAM-Based FPGA routing network to delay changes induced by ionizing radiation. IEEE Transactions on Nuclear Science, 66(3), 643-654. Lien externe

Darvishi, M., Audet, Y., & Blaquière, Y. (2018). Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA. IEEE Transactions on Nuclear Science, 65(5), 1153-1160. Lien externe

Dehnavi, M. M., Audet, Y., & Khamsehashari, E. (juin 2016). Differential integrator pixel architecture for dark current compensation in CMOS image sensors [Communication écrite]. 14th IEEE International New Circuits and Systems Conference (NEWCAS 2016), Vancouver, Canada (4 pages). Lien externe

Darvishi, M., Audet, Y., Blaquiere, Y., Thibeault, C., Pichette, S., & Tazi, F. Z. (2014). Circuit level modeling of extra combinational delays in SRAM-based FPGAs due to transient ionizing radiation. IEEE Transactions on Nuclear Science, 61(6), 3535-3542. Lien externe

Djaja, S., Chapman, G. H., Cheung, D. Y. H., & Audet, Y. (novembre 2003). Implementation and testing of fault-tolerant photodiode-based active pixel sensor (APS) [Communication écrite]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. Lien externe

E

Esmaeilzadeh, M., Audet, Y., Ali, M., & Sawan, M. (2023). A Wide-range Low-power Thyristor-based Delay Element with Improved Temperature Sensitivity. IEEE Transactions on Circuits and Systems II: Express Briefs, 70(7), 2370-2374. Lien externe

Esmaeilzadeh, M., Audet, Y., Ali, M., & Sawan, M. (2022). A Low-Offset VCO-Based Time-Domain Comparator Using a Phase Frequency Detector With Reduced Dead and Blind Zones. IEEE Transactions on Circuits and Systems I: Regular Papers, 70(3), 1017-1029. Lien externe

Esmaeilzadeh, M., Audet, Y., Ali, M., & Sawan, M. (2022). A Low-Phase-Noise CMOS Ring Voltage-Controlled Oscillator Intended for Time-Based Sensor Interfaces. IEEE Access, 10, 101186-101197. Lien externe

Esmaeilzadeh, M., Ali, M., Hassan, A., Audet, Y., & Sawan, M. (juin 2020). Low-power high-accuracy VCO-based comparator for sensor interface applications [Communication écrite]. 18th IEEE International New Circuits and Systems Conference (NEWCAS 2020), Montréal, Qc, Canada. Lien externe

H

Hoque, M. U., Kumar, D., Audet, Y., & Savaria, Y. (2022). Design and Analysis of a 35 GHz Rectenna System for Wireless Power Transfer to an Unmanned Air Vehicle. Energies, 15(1), 19 pages. Lien externe

Hobeika, C., Pichette, S., Leonard, M. A., Thibeault, C., Boland, J. F., & Audet, Y. (juillet 2014). Multi-abstraction level signature generation and comparison based on radiation single event upset [Communication écrite]. 20th IEEE International On-Line Testing Symposium (IOLTS 2014), Catalunya, Spain. Lien externe

Hobeika, C., Pichette, S., Ghodbane, A., Thibeault, C., Audet, Y., Boland, J.-F., & Saad, M. (2013). Flight control fault models based on SEU emulation. SAE International Journal of Aerospace, 6(2), 643-649. Lien externe

Hamine, M., Audet, Y., & David, J. P. (août 2007). A real time image reconstruction algorithm for an integrated fingerprint sensor [Communication écrite]. IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007), Montréal, Québec. Lien externe

K

Khamsehashari, E., & Audet, Y. (juin 2011). Mode detection of a linear-logarithmic current-mode image sensor [Communication écrite]. 9th IEEE International New Circuits and Systems Conference (NEWCAS 2011), Bordeaux, France. Lien externe

Khamsehashari, E., Audet, Y., & Fayomi, C. (juin 2010). Digital linearity correction of a wide dynamic range current-mode image sensor [Communication écrite]. 8th IEEE International NEWCAS Conference (NEWCAS 2010), Montréal, Québec. Lien externe

L

La Haye, M. L., Chapman, G. H., Jung, C., Cheung, D. Y. H., Djaja, S., & Audet, Y. (janvier 2023). Fault-tolerant photodiode and photogate active pixel sensors [Communication écrite]. Sensors and camera systems for scientific and industrial applications VI, San Jose, CA (12 pages). Lien externe

La Haye, M. L., Chapman, G. H., Jung, C., Cheung, D. Y., Djaja, S., & Audet, Y. (octobre 2004). Characteristics of fault-tolerant photodiode and photogate active pixel sensors (APS) [Communication écrite]. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2004), Cannes, France. Lien externe

M

Mirfakhraei, S. S., Audet, Y., Hassan, A., & Sawan, M. (2022). A Fully Integrated Low-Power Hall-Based Isolation Amplifier With IMR Greater Than 120 dB. IEEE Transactions on Circuits and Systems I: Regular Papers, 69(4), 1385-1394. Disponible

Mirfakhraei, S. S., Audet, Y., Hassan, A., & Sawan, M. (2022). A Small Footprint Digital Isolator based on CMOS Integrated Hall-effect Sensor. IEEE Sensors Journal, 22(1), 412-418. Disponible

Mirfakhraei, S. S., Audet, Y., Hassan, A., & Sawan, M. (2021). A Galvanic Isolated Amplifier Based on CMOS Integrated Hall-Effect Sensors. IEEE Transactions on Circuits and Systems I-Regular Papers, 68(4), 1388-1397. Disponible

Mirfakhraei, S. S., Audet, Y., Hassan, A., Ali, M., Nabavi, M., & Sawan, M. (juin 2020). A CMOS MAGFET-based programmable isolation amplifier [Communication écrite]. 18th IEEE International New Circuits and Systems Conference (NEWCAS 2020), Montréal, Qc, Canada. Lien externe

Mirfakhraei, S. S., Audet, Y., Nabavi, M., Youness, B., Ali, M., Hassan, A., & Sawan, M. (octobre 2020). Wide Dynamic Range Front-End Programmable Isolation Amplifier using Integrated CMOS Hall Effect Sensor [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2020), Sevilla, Spain (5 pages). Lien externe

S

Singh, R., Audet, Y., Gagnon, Y., Savaria, Y., Boulais, E., & Meunier, M. (2011). A laser-trimmed rail-to-rail precision CMOS operational amplifier. IEEE Transactions on Circuits and Systems II: Express Briefs, 58(2), 75-79. Lien externe

Singh, R., Audet, Y., Gagnon, Y., & Savaria, Y. (mai 2007). Integrated circuit trimming technique for offset reduction in a precision CMOS amplifier [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2007), New Orleans, LA, USA. Lien externe

Sawan, M., Trépanier, A., Trépanier, J.-L., Audet, Y., & Ghannoum, R. (2006). A new CMOS multimode digital pixel sensor dedicated to an implantable visual cortical stimulator. Analog Integrated Circuits and Signal Processing, 49(2), 187-197. Lien externe

T

Trabelsi, A., Mohamed, O. A., & Audet, Y. (2015). Robust parametric modeling of speech in additive white Gaussian noise. Journal of Signal and Information Processing, 6(2), 99-108. Disponible

Tazi, F. Z., Thibeault, C., Savaria, Y., Pichette, S., & Audet, Y. (2014). On extra delays affecting I/O blocks of an SRAM-based FPGA due to ionizing radiation. IEEE Transactions on Nuclear Science, 61(6), 3138-3145. Lien externe

Thibeault, C., Hariri, Y., Hasan, S. R., Hobeika, C., Savaria, Y., Audet, Y., & Tazi, F. Z. (2013). A library-based early soft error sensitivity analysis technique for SRAM-based FPGA design. Journal of Electronic Testing: Theory and Applications, 29(4), 457-471. Lien externe

Thibeault, C., Pichette, S., Audet, Y., Savaria, Y., Rufenacht, H., Gloutnay, E., Blaquiere, Y., Moupfouma, F., & Batani, N. (2012). On Extra Combinational Delays in SRAM FPGAs Due to Transient Ionizing Radiations. IEEE Transactions on Nuclear Science, 59(6), 2959-65. Lien externe

Trépanier, A., Trépanier, J. L., Sawan, M., & Audet, Y. (juillet 2004). A multiple operation mode CMOS digital pixel sensor dedicated to a visual cortical implant [Communication écrite]. 47th Midwest Symposium on Circuits and Systems (MWSCAS 2004), Hiroshima, Japan. Lien externe

Trépanier, A., Trépanier, J. L., Sawan, M., & Audet, Y. (septembre 2004). New CMOS digital pixel sensor architecture dedicated to a visual cortical implant [Communication écrite]. Photonics North 2004, Ottawa. Lien externe

Trabelsi, A., Savaria, Y., & Audet, Y. (janvier 2003). Automatic offset correction technique based on active load tuning [Communication écrite]. 1st Annual Northeast Workshop on Circuits and Systems (NEWCAS 2003), Montréal, Québec. Non disponible

Trépanier, J. L., Sawan, M., & Audet, Y. (mai 2003). A New Cmos Architecture for Wide Dynamic Range Image Sensing [Communication écrite]. Canadian Conference on Electrical and Computer Engineering (CCECE 2003), Montreal, QC, Canada. Lien externe

Trépanier, J.-L., Sawan, M., Audet, Y., & Coulombe, J. (août 2002). A wide dynamic range CMOS digital pixel sensor [Communication écrite]. 45th Midwest Symposium on Circuits and Systems (MWSCAS 2002), Tulsa, OK. Lien externe

Z

Zhang, K., Burasa, P., & Audet, Y. (2017). A novel CMOS spectrometer based on wavelength absorption. Sensors and Actuators A: Physical, 268, 9-15. Lien externe

Zhang, K., & Audet, Y. (octobre 2016). A novel wavelength detection method based on wavelength absorption in silicon [Communication écrite]. COMSOL 2016, Boston, Mass. (4 pages). Lien externe

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