Mostafa Darvishi, Yves Audet
and Yves Blaquière
Article (2018)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/39633/ |
| Journal Title: | IEEE Transactions on Nuclear Science (vol. 65, no. 5) |
| Publisher: | IEEE |
| DOI: | 10.1109/tns.2018.2828785 |
| Official URL: | https://doi.org/10.1109/tns.2018.2828785 |
| Date Deposited: | 18 Apr 2023 15:03 |
| Last Modified: | 25 Sep 2024 16:24 |
| Cite in APA 7: | Darvishi, M., Audet, Y., & Blaquière, Y. (2018). Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA. IEEE Transactions on Nuclear Science, 65(5), 1153-1160. https://doi.org/10.1109/tns.2018.2828785 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
