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Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA

Mostafa Darvishi, Yves Audet and Yves Blaquière

Article (2018)

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Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/39633/
Journal Title: IEEE Transactions on Nuclear Science (vol. 65, no. 5)
Publisher: IEEE
DOI: 10.1109/tns.2018.2828785
Official URL: https://doi.org/10.1109/tns.2018.2828785
Date Deposited: 18 Apr 2023 15:03
Last Modified: 05 Apr 2024 11:35
Cite in APA 7: Darvishi, M., Audet, Y., & Blaquière, Y. (2018). Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA. IEEE Transactions on Nuclear Science, 65(5), 1153-1160. https://doi.org/10.1109/tns.2018.2828785

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