Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Cheung and Yves Audet
Paper (2003)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/25952/ |
| Conference Title: | 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003) |
| Conference Location: | Boston, MA, United states |
| Conference Date(s): | 2003-11-03 - 2003-11-05 |
| Publisher: | IEEE Comput. Soc |
| DOI: | 10.1109/dftvs.2003.1250095 |
| Official URL: | https://doi.org/10.1109/dftvs.2003.1250095 |
| Date Deposited: | 18 Apr 2023 15:19 |
| Last Modified: | 25 Sep 2024 16:06 |
| Cite in APA 7: | Djaja, S., Chapman, G. H., Cheung, D. Y. H., & Audet, Y. (2003, November). Implementation and testing of fault-tolerant photodiode-based active pixel sensor (APS) [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. https://doi.org/10.1109/dftvs.2003.1250095 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
