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Word cloudA word cloud is a visual representation of the most frequently used words in a text or a set of texts. The words appear in different sizes, with the size of each word being proportional to its frequency of occurrence in the text. The more frequently a word is used, the larger it appears in the word cloud. This technique allows for a quick visualization of the most important themes and concepts in a text.
In the context of this page, the word cloud was generated from the publications of the author {}. The words in this cloud come from the titles, abstracts, and keywords of the author's articles and research papers. By analyzing this word cloud, you can get an overview of the most recurring and significant topics and research areas in the author's work.
The word cloud is a useful tool for identifying trends and main themes in a corpus of texts, thus facilitating the understanding and analysis of content in a visual and intuitive way.
Audet, Y., & Chapman, G. H. (2001, October). Design of a self-correcting active pixel sensor [Paper]. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, San Francisco, CA, USA. External link
Cheung, D. Y. H., Chapman, G. H., Djaja, S., Audet, Y., Wai, B., & Jung, C. (2004, January). Fault tolerant Active Pixel Sensors for large area digital imaging systems [Paper]. Optoelectronic integrated circuits VI, San Jose CA. External link
Chapman, G. H., Djaja, S., Cheung, D. Y. H., Audet, Y., Koren, I., & Koren, Z. (2004). A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Design & Test of Computers, 21(6), 544-551. External link
Djaja, S., Chapman, G. H., Cheung, D. Y. H., & Audet, Y. (2003, November). Implementation and testing of fault-tolerant photodiode-based active pixel sensor (APS) [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. External link
La Haye, M. L., Chapman, G. H., Jung, C., Cheung, D. Y. H., Djaja, S., & Audet, Y. (2023, January). Fault-tolerant photodiode and photogate active pixel sensors [Paper]. Sensors and camera systems for scientific and industrial applications VI, San Jose, CA (12 pages). External link
La Haye, M. L., Chapman, G. H., Jung, C., Cheung, D. Y., Djaja, S., & Audet, Y. (2004, October). Characteristics of fault-tolerant photodiode and photogate active pixel sensors (APS) [Paper]. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2004), Cannes, France. External link
