Claude Thibeault, Y. Hariri, S. R. Hasan, C. Hobeika, Yvon Savaria
, Yves Audet and F. Z. Tazi
Article (2013)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/13029/ |
| Journal Title: | Journal of Electronic Testing: Theory and Applications (vol. 29, no. 4) |
| Publisher: | Springer |
| DOI: | 10.1007/s10836-013-5393-9 |
| Official URL: | https://doi.org/10.1007/s10836-013-5393-9 |
| Date Deposited: | 18 Apr 2023 15:10 |
| Last Modified: | 08 Apr 2025 01:40 |
| Cite in APA 7: | Thibeault, C., Hariri, Y., Hasan, S. R., Hobeika, C., Savaria, Y., Audet, Y., & Tazi, F. Z. (2013). A library-based early soft error sensitivity analysis technique for SRAM-based FPGA design. Journal of Electronic Testing: Theory and Applications, 29(4), 457-471. https://doi.org/10.1007/s10836-013-5393-9 |
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