C. Hobeika, S. Pichette, M. A. Leonard, C. Thibeault, J. F. Boland and Yves Audet
Paper (2014)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/12188/ |
| Conference Title: | 20th IEEE International On-Line Testing Symposium (IOLTS 2014) |
| Conference Location: | Catalunya, Spain |
| Conference Date(s): | 2014-07-07 - 2014-07-09 |
| Publisher: | IEEE Computer Society |
| DOI: | 10.1109/iolts.2014.6873700 |
| Official URL: | https://doi.org/10.1109/iolts.2014.6873700 |
| Date Deposited: | 18 Apr 2023 15:08 |
| Last Modified: | 25 Sep 2024 15:48 |
| Cite in APA 7: | Hobeika, C., Pichette, S., Leonard, M. A., Thibeault, C., Boland, J. F., & Audet, Y. (2014, July). Multi-abstraction level signature generation and comparison based on radiation single event upset [Paper]. 20th IEEE International On-Line Testing Symposium (IOLTS 2014), Catalunya, Spain. https://doi.org/10.1109/iolts.2014.6873700 |
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