Christelle Hobeika, Simon Pichette, Marc-André Léonard, Claude Thibeault, Jean-François Boland, Yves Audet
Paper (2014)
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ISBN:
9781479953240
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Conference Title:
20th IEEE International On-Line Testing Symposium (IOLTS 2014)
Conference Location:
Catalunya, Spain
Conference Date(s):
2014-07-07 - 2014-07-09
Publisher:
IEEE Computer Society
Official URL:
OAI:
oai:publications.polymtl.ca:12188
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Date Deposited:
18 Apr 2023 15:08
Last Modified:
14 Oct 2026 11:12
Cite in APA 7:
Hobeika, C., Pichette, S., Léonard, M.-A., Thibeault, C., Boland, J.-F., & Audet, Y. (2014, July). Multi-abstraction level signature generation and comparison based on radiation single event upset [Paper]. 20th IEEE International On-Line Testing Symposium (IOLTS 2014), Catalunya, Spain. https://doi.org/10.1109/iolts.2014.6873700
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