Claude Thibeault, Simon Pichette, Yves Audet
, Yvon Savaria, Hermann Rufenacht, Eric Gloutnay, Yves Blaquière, Fidele Moupfouma and Naïm Batani
Article (2012)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/14537/ |
| Journal Title: | IEEE Transactions on Nuclear Science (vol. 59, no. 6) |
| Publisher: | IEEE |
| DOI: | 10.1109/tns.2012.2222668 |
| Official URL: | https://doi.org/10.1109/tns.2012.2222668 |
| Date Deposited: | 18 Apr 2023 15:11 |
| Last Modified: | 08 Apr 2025 01:41 |
| Cite in APA 7: | Thibeault, C., Pichette, S., Audet, Y., Savaria, Y., Rufenacht, H., Gloutnay, E., Blaquière, Y., Moupfouma, F., & Batani, N. (2012). On Extra Combinational Delays in SRAM FPGAs Due to Transient Ionizing Radiations. IEEE Transactions on Nuclear Science, 59(6), 2959-65. https://doi.org/10.1109/tns.2012.2222668 |
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