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Abderrahman, A., Cerny, E., & Kaminska, B. (1996). Optimization-based multifrequency test generation for analog circuits. Journal of Electronic Testing: Theory and Applications (JETTA), 9(1-2), 59-73. Lien externe
Abderrahman, A., Savaria, Y., & Kaminska, B. (1996). Analyse, estimation et réduction du bruit de commutation simultanée. [Analysis, estimation and reduction of simultaneous switching noise]. Canadian Journal of Electrical and Computer Engineering, 21(4), 133-143. Lien externe
Aourid, S. M., & Kaminska, B. (1996). Minimization of the 0-1 linear-programming problem under linear constraints by using neural networks - synthesis and analysis. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, 43(5), 421-425. Lien externe
Arabi, K., & Kaminska, B. (octobre 1996). A new technique to monitor the electrode and lead failures in implantable microstimulators and sensors [Communication écrite]. 1996 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Amsterdam, Netherlands. Lien externe
Arabi, K., & Kaminska, B. (avril 1996). Oscillation-test strategy for analog and mixed-signal integrated circuits [Communication écrite]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
Arabi, K., & Kaminska, B. (octobre 1996). A practical and low-cost test method to design reliable implantable systems [Communication écrite]. 1996 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Amsterdam, Netherlands. Lien externe
Arabi, K., Kaminska, B., & Rzeszut, J. (1996). BIST for D/A and A/D converters. IEEE Design & Test of Computers, 13(4), 40-49. Lien externe
Arabi, K., Kaminska, B., & Sunter, S. (octobre 1996). Design for testability of integrated operational amplifiers using oscillation-test strategy [Communication écrite]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. Lien externe
Belhaouane, A., Savaria, Y., & Kaminska, B. (janvier 1996). Reconstruction method for data acquisition systems with randomly distributed jitter [Communication écrite]. 2nd IEEE International Mixed Signal Testing Workshop. Non disponible
Belhaouane, A., Savaria, Y., Kaminska, B., & Massicotte, D. (1996). Reconstruction method for jitter tolerant data acquisition system. Journal of Electronic Testing: Theory and Applications, 9(1-2), 177-185. Lien externe
Ben-Hamida, N., Ayari, B., & Kaminska, B. (octobre 1996). Testing of embedded A/D converters in mixed-signal circuit [Communication écrite]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. Lien externe
Boubezari, S., & Kaminska, B. (1996). New reconfigurable test vector generator for built-in self-test applications. Journal of Electronic Testing: Theory and Applications (JETTA), 8(2), 153-164. Lien externe
Ehsanian, M., & Kaminska, B. (1996). BiCMOS wideband operational amplifier with 900 MHz gain-bandwidth and 90 dB DC gain. Analog Integrated Circuits and Signal Processing, 11(1), 63-71. Lien externe
Ehsanian, M., Kaminska, B., & Arabi, K. (avril 1996). New digital test approach for analog-to-digital converter testing [Communication écrite]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
Fares, M., & Kaminska, B. (mai 1994). Test strategy selection for multi-chip systems [Communication écrite]. 1994 3rd International Conference on the Economics of Design, Test, and Manufacturing, Austin, TX, USA. Lien externe
Hamida, N. B., Saab, K., Marche, D., Kaminska, B., & Quesnel, G. (octobre 1996). LIMSoft: Automated tool for design and test integration of analog circuits [Communication écrite]. 1996 IEEE International Test Conference, Washington, DC, USA. Lien externe
Kaminska, B. (1996). IEEE mixed-signal testing workshop. IEEE Design & Test of Computers, 13(3), 114-114. Non disponible
Kaminska, B., & Courtois, B. (1996). Guest editors introduction - mixed analog and digital-systems. IEEE Design & Test of Computers, 13(2), 8-9. Lien externe
Rayapati, V. N., & Kaminska, B. (1996). Interconnect propagation delay modeling and validation for the 16-MB CMOS SRAM chip. IEEE Transactions on Components, Packaging, and Manufacturing Technology. Part B, Advanced Packaging, 19(3), 605-614. Lien externe
Saab, K., Marche, D., Hamida, N. B., & Kaminska, B. (1996). LIMSoft : automated tool for sensitivity analysis and test vector generation : Mixed signal & analogue IC test technology. IEE Proceedings. Circuits, Devices and Systems, 143(6), 386-392. Lien externe
Slamani, M., & Kaminska, B. (1996). Fault observability analysis of analog circuits in frequency-domain. IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 43(2), 134-139. Lien externe
Sokolowska, E., Belabbes, N. E., & Kaminska, B. (avril 1996). Integrated analog switch matrix with large input signal and 46dB isolation at 1 GHz [Communication écrite]. 1996 International IFIP-IEEE Conference on Broadband Communications, Montréal, Québec. Lien externe
Soufi, M., Rochon, S., Savaria, Y., & Kaminska, B. (avril 1996). Design and performance of CMOS TSPC cells for high speed pseudo random testing [Communication écrite]. 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
Abderrahman, A., Cerny, E., & Kaminska, B. (1996). Optimization-based multifrequency test generation for analog circuits. Journal of Electronic Testing: Theory and Applications (JETTA), 9(1-2), 59-73. Lien externe
Abderrahman, A., Savaria, Y., & Kaminska, B. (1996). Analyse, estimation et réduction du bruit de commutation simultanée. [Analysis, estimation and reduction of simultaneous switching noise]. Canadian Journal of Electrical and Computer Engineering, 21(4), 133-143. Lien externe
Aourid, S. M., & Kaminska, B. (1996). Minimization of the 0-1 linear-programming problem under linear constraints by using neural networks - synthesis and analysis. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, 43(5), 421-425. Lien externe
Arabi, K., & Kaminska, B. (octobre 1996). A new technique to monitor the electrode and lead failures in implantable microstimulators and sensors [Communication écrite]. 1996 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Amsterdam, Netherlands. Lien externe
Arabi, K., & Kaminska, B. (avril 1996). Oscillation-test strategy for analog and mixed-signal integrated circuits [Communication écrite]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
Arabi, K., & Kaminska, B. (octobre 1996). A practical and low-cost test method to design reliable implantable systems [Communication écrite]. 1996 18th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Amsterdam, Netherlands. Lien externe
Arabi, K., Kaminska, B., & Rzeszut, J. (1996). BIST for D/A and A/D converters. IEEE Design & Test of Computers, 13(4), 40-49. Lien externe
Arabi, K., Kaminska, B., & Sunter, S. (octobre 1996). Design for testability of integrated operational amplifiers using oscillation-test strategy [Communication écrite]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. Lien externe
Belhaouane, A., Savaria, Y., & Kaminska, B. (janvier 1996). Reconstruction method for data acquisition systems with randomly distributed jitter [Communication écrite]. 2nd IEEE International Mixed Signal Testing Workshop. Non disponible
Belhaouane, A., Savaria, Y., Kaminska, B., & Massicotte, D. (1996). Reconstruction method for jitter tolerant data acquisition system. Journal of Electronic Testing: Theory and Applications, 9(1-2), 177-185. Lien externe
Ben-Hamida, N., Ayari, B., & Kaminska, B. (octobre 1996). Testing of embedded A/D converters in mixed-signal circuit [Communication écrite]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. Lien externe
Boubezari, S., & Kaminska, B. (1996). New reconfigurable test vector generator for built-in self-test applications. Journal of Electronic Testing: Theory and Applications (JETTA), 8(2), 153-164. Lien externe
Ehsanian, M., & Kaminska, B. (1996). BiCMOS wideband operational amplifier with 900 MHz gain-bandwidth and 90 dB DC gain. Analog Integrated Circuits and Signal Processing, 11(1), 63-71. Lien externe
Ehsanian, M., Kaminska, B., & Arabi, K. (avril 1996). New digital test approach for analog-to-digital converter testing [Communication écrite]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
Fares, M., & Kaminska, B. (mai 1994). Test strategy selection for multi-chip systems [Communication écrite]. 1994 3rd International Conference on the Economics of Design, Test, and Manufacturing, Austin, TX, USA. Lien externe
Hamida, N. B., Saab, K., Marche, D., Kaminska, B., & Quesnel, G. (octobre 1996). LIMSoft: Automated tool for design and test integration of analog circuits [Communication écrite]. 1996 IEEE International Test Conference, Washington, DC, USA. Lien externe
Kaminska, B. (1996). IEEE mixed-signal testing workshop. IEEE Design & Test of Computers, 13(3), 114-114. Non disponible
Kaminska, B., & Courtois, B. (1996). Guest editors introduction - mixed analog and digital-systems. IEEE Design & Test of Computers, 13(2), 8-9. Lien externe
Rayapati, V. N., & Kaminska, B. (1996). Interconnect propagation delay modeling and validation for the 16-MB CMOS SRAM chip. IEEE Transactions on Components, Packaging, and Manufacturing Technology. Part B, Advanced Packaging, 19(3), 605-614. Lien externe
Saab, K., Marche, D., Hamida, N. B., & Kaminska, B. (1996). LIMSoft : automated tool for sensitivity analysis and test vector generation : Mixed signal & analogue IC test technology. IEE Proceedings. Circuits, Devices and Systems, 143(6), 386-392. Lien externe
Slamani, M., & Kaminska, B. (1996). Fault observability analysis of analog circuits in frequency-domain. IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 43(2), 134-139. Lien externe
Sokolowska, E., Belabbes, N. E., & Kaminska, B. (avril 1996). Integrated analog switch matrix with large input signal and 46dB isolation at 1 GHz [Communication écrite]. 1996 International IFIP-IEEE Conference on Broadband Communications, Montréal, Québec. Lien externe
Soufi, M., Rochon, S., Savaria, Y., & Kaminska, B. (avril 1996). Design and performance of CMOS TSPC cells for high speed pseudo random testing [Communication écrite]. 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. Lien externe
