Mehdi Ehsanian, Bozena Kaminska and Karim Arabi
Paper (1996)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/31343/ |
| Conference Title: | 1996 14th IEEE VLSI Test Symposium |
| Conference Location: | Princeton, NJ, USA |
| Conference Date(s): | 1996-04-28 - 1996-05-01 |
| Publisher: | IEEE |
| DOI: | 10.1109/vtest.1996.510836 |
| Official URL: | https://doi.org/10.1109/vtest.1996.510836 |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 25 Sep 2024 16:13 |
| Cite in APA 7: | Ehsanian, M., Kaminska, B., & Arabi, K. (1996, April). New digital test approach for analog-to-digital converter testing [Paper]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. https://doi.org/10.1109/vtest.1996.510836 |
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