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Oscillation-test strategy for analog and mixed-signal integrated circuits

Karim Arabi and Bozena Kaminska

Paper (1996)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/31567/
Conference Title: 1996 14th IEEE VLSI Test Symposium
Conference Location: Princeton, NJ, USA
Conference Date(s): 1996-04-28 - 1996-05-01
Publisher: IEEE
DOI: 10.1109/vtest.1996.510896
Official URL: https://doi.org/10.1109/vtest.1996.510896
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Arabi, K., & Kaminska, B. (1996, April). Oscillation-test strategy for analog and mixed-signal integrated circuits [Paper]. 1996 14th IEEE VLSI Test Symposium, Princeton, NJ, USA. https://doi.org/10.1109/vtest.1996.510896

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