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LIMSoft : automated tool for sensitivity analysis and test vector generation : Mixed signal & analogue IC test technology

K. Saab, D. Marche, N. B. Hamida and Bozena Kaminska

Article (1996)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/30899/
Journal Title: IEE Proceedings. Circuits, Devices and Systems (vol. 143, no. 6)
Publisher: IET
DOI: 10.1049/ip-cds:19960934
Official URL: https://doi.org/10.1049/ip-cds%3a19960934
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:20
Cite in APA 7: Saab, K., Marche, D., Hamida, N. B., & Kaminska, B. (1996). LIMSoft : automated tool for sensitivity analysis and test vector generation : Mixed signal & analogue IC test technology. IEE Proceedings. Circuits, Devices and Systems, 143(6), 386-392. https://doi.org/10.1049/ip-cds%3a19960934

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