LIMSoft : automated tool for sensitivity analysis and test vector generation : Mixed signal & analogue IC test technology

K. Saab, D. Marche, Naim BenHamida and Bożena Kamińska

Article (1996)

An external link is available for this item

Additional Information:	Nom historique du département: Département de génie électrique et de génie informatique
Department:	Department of Electrical Engineering Department of Computer Engineering and Software Engineering
PolyPublie URL:	https://publications.polymtl.ca/30899/
Journal Title:	IEE Proceedings. Circuits, Devices and Systems (vol. 143, no. 6)
Publisher:	IET
DOI:	10.1049/ip-cds:19960934
Official URL:	https://doi.org/10.1049/ip-cds%3a19960934
Date Deposited:	18 Apr 2023 15:24
Last Modified:	14 Apr 2026 10:44

Cite in APA 7:	Saab, K., Marche, D., BenHamida, N., & Kamińska, B. (1996). LIMSoft : automated tool for sensitivity analysis and test vector generation : Mixed signal & analogue IC test technology. IEE Proceedings. Circuits, Devices and Systems, 143(6), 386-392. https://doi.org/10.1049/ip-cds%3a19960934
APA 7 (HTML)ASCII CitationAtomBibTeXDOIsDublin CoreEndNote (.ENW)MARC (ISO 2709/UTF-8) (.MRC)MARC (UTF-8) (.MRK8)MARC XMLMPEG-21 DIDLMultiline CSVOAI-ORE Resource Map (Atom Format)OPENAIREOpenURL ContextObjectOpenURL ContextObject in SpanRDF+N-TriplesRDF+N3RDF+XMLReferReference Manager (.RIS)Simple Metadata

Statistics

Repository Staff Only