Naim Ben-Hamida, Bechir Ayari and Bożena Kamińska
Paper (1996)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/31512/ |
| Conference Title: | 1996 International Conference on Computer Design, ICCD'96 |
| Conference Location: | Austin, TX, USA |
| Conference Date(s): | 1996-10-07 - 1996-10-09 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/iccd.1996.563546 |
| Official URL: | https://doi.org/10.1109/iccd.1996.563546 |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 14 Apr 2026 10:16 |
| Cite in APA 7: | Ben-Hamida, N., Ayari, B., & Kamińska, B. (1996, October). Testing of embedded A/D converters in mixed-signal circuit [Paper]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. https://doi.org/10.1109/iccd.1996.563546 |
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