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Testing of embedded A/D converters in mixed-signal circuit

Naim Ben-Hamida, Bechir Ayari and Bozena Kaminska

Paper (1996)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/31512/
Conference Title: 1996 International Conference on Computer Design, ICCD'96
Conference Location: Austin, TX, USA
Conference Date(s): 1996-10-07 - 1996-10-09
Publisher: IEEE
DOI: 10.1109/iccd.1996.563546
Official URL: https://doi.org/10.1109/iccd.1996.563546
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Ben-Hamida, N., Ayari, B., & Kaminska, B. (1996, October). Testing of embedded A/D converters in mixed-signal circuit [Paper]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. https://doi.org/10.1109/iccd.1996.563546

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