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Test strategy selection for multi-chip systems

Mounir Fares and Bozena Kaminska

Paper (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/31326/
Conference Title: 1994 3rd International Conference on the Economics of Design, Test, and Manufacturing
Conference Location: Austin, TX, USA
Conference Date(s): 1994-05-16 - 1994-05-17
Publisher: IEEE
DOI: 10.1109/icedtm.1994.496097
Official URL: https://doi.org/10.1109/icedtm.1994.496097
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Fares, M., & Kaminska, B. (1994, May). Test strategy selection for multi-chip systems [Paper]. 1994 3rd International Conference on the Economics of Design, Test, and Manufacturing, Austin, TX, USA. https://doi.org/10.1109/icedtm.1994.496097

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