A. Abderrahman, Eduard Cerny and Bożena Kamińska
Article (1996)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/31599/ |
| Journal Title: | Journal of Electronic Testing: Theory and Applications (JETTA) (vol. 9, no. 1-2) |
| Publisher: | Springer |
| DOI: | 10.1007/bf00137565 |
| Official URL: | https://doi.org/10.1007/bf00137565 |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 13 Apr 2026 11:08 |
| Cite in APA 7: | Abderrahman, A., Cerny, E., & Kamińska, B. (1996). Optimization-based multifrequency test generation for analog circuits. Journal of Electronic Testing: Theory and Applications (JETTA), 9(1-2), 59-73. https://doi.org/10.1007/bf00137565 |
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