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Optimization-based multifrequency test generation for analog circuits

A. Abderrahman, E. Cerny and Bozena Kaminska

Article (1996)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/31599/
Journal Title: Journal of Electronic Testing: Theory and Applications (JETTA) (vol. 9, no. 1-2)
Publisher: Springer
DOI: 10.1007/bf00137565
Official URL: https://doi.org/10.1007/bf00137565
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Abderrahman, A., Cerny, E., & Kaminska, B. (1996). Optimization-based multifrequency test generation for analog circuits. Journal of Electronic Testing: Theory and Applications (JETTA), 9(1-2), 59-73. https://doi.org/10.1007/bf00137565

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